Hiroshi Tomita

Person

Aichi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Thermionic power generation element and thermionic power generation...
- Patent number 12,165,858
- Issue date Dec 10, 2024
- Kabushiki Kaisha Toshiba
- Shigeya Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power generation element
- Patent number 11,855,579
- Issue date Dec 26, 2023
- Kabushiki Kaisha Toshiba
- Shigeya Kimura
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Power generation element and power generation system
- Patent number 11,805,698
- Issue date Oct 31, 2023
- Kabushiki Kaisha Toshiba
- Hisashi Yoshida
Information Patent Grant
Particle measuring device, calibration method, and measuring device
- Patent number 11,774,340
- Issue date Oct 3, 2023
- National Institute of Advanced Industrial Science and Technology
- Haruhisa Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Treatment condition setting method, storage medium, and substrate t...
- Patent number 11,726,438
- Issue date Aug 15, 2023
- Tokyo Electron Limited
- Takuya Mori
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron emitting element and power generation element
- Patent number 11,664,182
- Issue date May 30, 2023
- Kabushiki Kaisha Toshiba
- Shigeya Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate inspection method, substrate inspection system, and contr...
- Patent number 11,461,885
- Issue date Oct 4, 2022
- Tokyo Electron Limited
- Toyohisa Tsuruda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical module
- Patent number 11,307,356
- Issue date Apr 19, 2022
- NTT Electronics Corporation
- Yuichi Suzuki
- G02 - OPTICS
Information Patent Grant
Particle measuring method and detection liquid
- Patent number 11,112,344
- Issue date Sep 7, 2021
- Kioxia Corporation
- Hiroshi Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Head mounted type video presenting device including visible light w...
- Patent number 10,924,719
- Issue date Feb 16, 2021
- JIG-SAW Inc.
- Hiroshi Tomita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Substrate processing apparatus and substrate processing method
- Patent number 10,799,917
- Issue date Oct 13, 2020
- Ebara Corporation
- Yu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 10,586,694
- Issue date Mar 10, 2020
- TOSHIBA MEMORY CORPORATION
- Masako Kodera
- B24 - GRINDING POLISHING
Information Patent Grant
Surface treatment apparatus and method for semiconductor substrate
- Patent number 10,573,508
- Issue date Feb 25, 2020
- TOSHIBA MEMORY CORPORATION
- Tatsuhiko Koide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate treatment method and substrate treatment apparatus
- Patent number 10,529,588
- Issue date Jan 7, 2020
- TOSHIBA MEMORY CORPORATION
- Yuya Akeboshi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Substrate processing apparatus and substrate processing method
- Patent number 10,328,465
- Issue date Jun 25, 2019
- Ebara Corporation
- Yu Ishii
- B08 - CLEANING
Information Patent Grant
Substrate defect inspection apparatus, method of adjusting sensitiv...
- Patent number 10,249,034
- Issue date Apr 2, 2019
- Tokyo Electron Limited
- Yasuhiro Kitada
- G01 - MEASURING TESTING
Information Patent Grant
Substrate processing method, substrate processing apparatus, and st...
- Patent number 10,199,240
- Issue date Feb 5, 2019
- TOSHIBA MEMORY CORPORATION
- Hidekazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjusment method of chemical liquid supply device, non-transitory s...
- Patent number 10,155,246
- Issue date Dec 18, 2018
- Tokyo Electron Limited
- Hiroshi Tomita
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Substrate processing method and storage medium
- Patent number 10,096,462
- Issue date Oct 9, 2018
- TOSHIBA MEMORY CORPORATION
- Hidekazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate treatment method and substrate treatment apparatus
- Patent number 10,014,186
- Issue date Jul 3, 2018
- TOSHIBA MEMORY CORPORATION
- Yuya Akeboshi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method of treating surface of semiconductor substrate
- Patent number 9,991,111
- Issue date Jun 5, 2018
- TOSHIBA MEMORY CORPORATION
- Yoshihiro Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method of treating surface of semiconductor substrate
- Patent number 9,859,111
- Issue date Jan 2, 2018
- TOSHIBA MEMORY CORPORATION
- Yoshihiro Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge exposure apparatus, edge exposure method and non-transitory co...
- Patent number 9,810,989
- Issue date Nov 7, 2017
- Tokyo Electron Limited
- Hiroshi Tomita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 9,673,217
- Issue date Jun 6, 2017
- Kabushiki Kaisha Toshiba
- Atsuko Sakata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Supercritical drying method for semiconductor substrate and supercr...
- Patent number 9,583,330
- Issue date Feb 28, 2017
- Tokyo Electron Limited
- Linan Ji
- F26 - DRYING
Information Patent Grant
Supercritical drying method for semiconductor substrate
- Patent number 9,570,286
- Issue date Feb 14, 2017
- Kabushiki Kaisha Toshiba
- Yohei Sato
- F26 - DRYING
Information Patent Grant
Optical circuit
- Patent number 9,500,811
- Issue date Nov 22, 2016
- NTT Electronics Corporation
- Hiroshi Tomita
- G02 - OPTICS
Information Patent Grant
Supercritical drying method for semiconductor substrate
- Patent number 9,437,416
- Issue date Sep 6, 2016
- Kabushiki Kaisha Toshiba
- Hidekazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coating and developing apparatus and method
- Patent number 9,417,529
- Issue date Aug 16, 2016
- Tokyo Electron Limited
- Nobuaki Matsuoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect analyzing apparatus, substrate processing system, defect ana...
- Patent number 9,342,880
- Issue date May 17, 2016
- Tokyo Electron Limited
- Shuji Iwanaga
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD
- Publication number 20240280459
- Publication date Aug 22, 2024
- KIOXIA Corporation
- Yusuke OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
WASHING DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20230330720
- Publication date Oct 19, 2023
- KIOXIA Corporation
- Naoki KANDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TREATMENT CONDITION SETTING METHOD, STORAGE MEDIUM, AND SUBSTRATE T...
- Publication number 20230333531
- Publication date Oct 19, 2023
- TOKYO ELECTRON LIMITED
- Takuya MORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE TREATMENT DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCT...
- Publication number 20230274953
- Publication date Aug 31, 2023
- KIOXIA Corporation
- Tooru MIKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION APPARATUS, SUBSTRATE INSPECTION METHOD, AND RE...
- Publication number 20230224559
- Publication date Jul 13, 2023
- TOKYO ELECTRON LIMITED
- Daisuke Kajiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMIONIC POWER GENERATION ELEMENT AND THERMIONIC POWER GENERATION...
- Publication number 20230066425
- Publication date Mar 2, 2023
- Kabushiki Kaisha Toshiba
- Shigeya KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE, DISPLAY METHOD, AND STORAGE MEDIUM
- Publication number 20220198981
- Publication date Jun 23, 2022
- TOKYO ELECTRON LIMITED
- Megumi JOHSAKA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
POWER GENERATION ELEMENT
- Publication number 20220166369
- Publication date May 26, 2022
- Kabushiki Kaisha Toshiba
- Shigeya KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER GENERATION ELEMENT AND POWER GENERATION SYSTEM
- Publication number 20220149257
- Publication date May 12, 2022
- Kabushiki Kaisha Toshiba
- Hisashi YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON EMITTING ELEMENT AND POWER GENERATION ELEMENT
- Publication number 20220139660
- Publication date May 5, 2022
- Kabushiki Kaisha Toshiba
- Shigeya KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE MEASURING DEVICE, CALIBRATION METHOD, AND MEASURING DEVICE
- Publication number 20210348999
- Publication date Nov 11, 2021
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Haruhisa KATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MODULE
- Publication number 20210003781
- Publication date Jan 7, 2021
- NTT ELECTRONICS CORPORATION
- Yuichi SUZUKI
- G02 - OPTICS
Information Patent Application
TREATMENT CONDITION SETTING METHOD, STORAGE MEDIUM, AND SUBSTRATE T...
- Publication number 20200393803
- Publication date Dec 17, 2020
- Tokyo Electron Limited
- Takuya MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
SUBSTRATE INSPECTION METHOD, SUBSTRATE INSPECTION SYSTEM, AND CONTR...
- Publication number 20200388025
- Publication date Dec 10, 2020
- TOKYO ELECTRON LIMITED
- Toyohisa TSURUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTICLE MEASURING METHOD AND DETECTION LIQUID
- Publication number 20200284714
- Publication date Sep 10, 2020
- KIOXIA Corporation
- Hiroshi TOMITA
- G01 - MEASURING TESTING
Information Patent Application
Head Mounted Type Video Presenting Device Including Visible Light W...
- Publication number 20190394439
- Publication date Dec 26, 2019
- JIG-SAW Inc.
- Hiroshi Tomita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
- Publication number 20190262870
- Publication date Aug 29, 2019
- EBARA CORPORATION
- Yu Ishii
- B08 - CLEANING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
- Publication number 20190262869
- Publication date Aug 29, 2019
- EBARA CORPORATION
- Yu Ishii
- B08 - CLEANING
Information Patent Application
SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS
- Publication number 20180301349
- Publication date Oct 18, 2018
- Toshiba Memory Corporation
- Yuya AKEBOSHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUS AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE
- Publication number 20180082832
- Publication date Mar 22, 2018
- Toshiba Memory Corporation
- Yoshihiro Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE DEFECT INSPECTION APPARATUS, METHOD OF ADJUSTING SENSITIV...
- Publication number 20180005370
- Publication date Jan 4, 2018
- TOKYO ELECTRON LIMITED
- Yasuhiro Kitada
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20160358768
- Publication date Dec 8, 2016
- Kabushiki Kaisha Toshiba
- Masako KODERA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS
- Publication number 20160351417
- Publication date Dec 1, 2016
- Kabushiki Kaisha Toshiba
- Yuya Akeboshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTMENT METHOD OF CHEMICAL LIQUID SUPPLY DEVICE, NON-TRANSITORY...
- Publication number 20160271640
- Publication date Sep 22, 2016
- TOKYO ELECTRON LIMITED
- Hiroshi TOMITA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
EDGE EXPOSURE APPARATUS, EDGE EXPOSURE METHOD AND NON-TRANSITORY CO...
- Publication number 20160246187
- Publication date Aug 25, 2016
- TOKYO ELECTRON LIMITED
- Hiroshi TOMITA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE
- Publication number 20160049289
- Publication date Feb 18, 2016
- Kabushiki Kaisha Toshiba
- Yoshihiro Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE TREATMENT APPARATUS AND METHOD FOR SEMICONDUCTOR SUBSTRATE
- Publication number 20150371845
- Publication date Dec 24, 2015
- Kabushiki Kaisha Toshiba
- Tatsuhiko KOIDE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL CIRCUIT
- Publication number 20150247970
- Publication date Sep 3, 2015
- NTT ELECTRONICS CORPORATION
- Hiroshi Tomita
- G02 - OPTICS
Information Patent Application
COATING AND DEVELOPING APPARATUS AND METHOD
- Publication number 20150219994
- Publication date Aug 6, 2015
- TOKYO ELECTRON LIMITED
- Nobuaki MATSUOKA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SUBSTRATE PROCESSING METHOD AND APPARATUS THEREFOR
- Publication number 20150206773
- Publication date Jul 23, 2015
- Kabushiki Kaisha Toshiba
- Hidekazu HAYASHI
- B08 - CLEANING

Hiroshi Tomita

Person

Patents Grantslast 30 patents

Thermionic power generation element and thermionic power generation...

Power generation element

Power generation element and power generation system

Particle measuring device, calibration method, and measuring device

Treatment condition setting method, storage medium, and substrate t...

Electron emitting element and power generation element

Substrate inspection method, substrate inspection system, and contr...

Optical module

Particle measuring method and detection liquid

Head mounted type video presenting device including visible light w...

Substrate processing apparatus and substrate processing method

Method for fabricating semiconductor device

Surface treatment apparatus and method for semiconductor substrate

Substrate treatment method and substrate treatment apparatus

Substrate processing apparatus and substrate processing method

Substrate defect inspection apparatus, method of adjusting sensitiv...

Substrate processing method, substrate processing apparatus, and st...

Adjusment method of chemical liquid supply device, non-transitory s...

Substrate processing method and storage medium

Substrate treatment method and substrate treatment apparatus

Apparatus and method of treating surface of semiconductor substrate

Apparatus and method of treating surface of semiconductor substrate

Edge exposure apparatus, edge exposure method and non-transitory co...

Semiconductor device and method for manufacturing same

Supercritical drying method for semiconductor substrate and supercr...

Supercritical drying method for semiconductor substrate

Optical circuit

Supercritical drying method for semiconductor substrate

Coating and developing apparatus and method

Defect analyzing apparatus, substrate processing system, defect ana...

Patents Applicationslast 30 patents

EVALUATION APPARATUS AND EVALUATION METHOD

WASHING DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

TREATMENT CONDITION SETTING METHOD, STORAGE MEDIUM, AND SUBSTRATE T...

SUBSTRATE TREATMENT DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCT...

SUBSTRATE INSPECTION APPARATUS, SUBSTRATE INSPECTION METHOD, AND RE...

THERMIONIC POWER GENERATION ELEMENT AND THERMIONIC POWER GENERATION...

DISPLAY DEVICE, DISPLAY METHOD, AND STORAGE MEDIUM

POWER GENERATION ELEMENT

POWER GENERATION ELEMENT AND POWER GENERATION SYSTEM

ELECTRON EMITTING ELEMENT AND POWER GENERATION ELEMENT

PARTICLE MEASURING DEVICE, CALIBRATION METHOD, AND MEASURING DEVICE

OPTICAL MODULE

TREATMENT CONDITION SETTING METHOD, STORAGE MEDIUM, AND SUBSTRATE T...

SUBSTRATE INSPECTION METHOD, SUBSTRATE INSPECTION SYSTEM, AND CONTR...

PARTICLE MEASURING METHOD AND DETECTION LIQUID

Head Mounted Type Video Presenting Device Including Visible Light W...

SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS

APPARATUS AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE

SUBSTRATE DEFECT INSPECTION APPARATUS, METHOD OF ADJUSTING SENSITIV...

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS

ADJUSTMENT METHOD OF CHEMICAL LIQUID SUPPLY DEVICE, NON-TRANSITORY...

EDGE EXPOSURE APPARATUS, EDGE EXPOSURE METHOD AND NON-TRANSITORY CO...

APPARATUS AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE

SURFACE TREATMENT APPARATUS AND METHOD FOR SEMICONDUCTOR SUBSTRATE

OPTICAL CIRCUIT

COATING AND DEVELOPING APPARATUS AND METHOD

SUBSTRATE PROCESSING METHOD AND APPARATUS THEREFOR