Hiroshi Tomiya

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Visual examination apparatus and visual examination method of semic...
- Patent number 6,094,263
- Issue date Jul 25, 2000
- Sony Corporation
- Hiroshi Tomiya
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection apparatus and method
- Patent number 5,452,080
- Issue date Sep 19, 1995
- Sony Corporation
- Hiroshi Tomiya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting IC leads
- Patent number 5,162,866
- Issue date Nov 10, 1992
- Sony Corporation
- Hiroshi Tomiya
- G01 - MEASURING TESTING