Hiroshi Touda

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 12,224,168
- Issue date Feb 11, 2025
- HITACHI HIGH-TECH CORPORATION
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage amplifier, high-voltage power supply, and mass spectro...
- Patent number 11,349,476
- Issue date May 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuki Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device provided with ion pump
- Patent number 10,121,631
- Issue date Nov 6, 2018
- Hitachi High-Technologies Corporation
- Masazumi Tone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light signal detecting circuit, light amount detecting device, and...
- Patent number 9,322,711
- Issue date Apr 26, 2016
- Hitachi High-Technologies Corporation
- Fujio Onishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20230056978
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Takuma NISHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE AMPLIFIER, HIGH-VOLTAGE POWER SUPPLY, AND MASS SPECTRO...
- Publication number 20210044293
- Publication date Feb 11, 2021
- Hitachi High-Tech Corporation
- Yuki Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE PROVIDED WITH ION PUMP
- Publication number 20180158648
- Publication date Jun 7, 2018
- Hitachi High-Technologies Corporation
- Masazumi TONE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT SIGNAL DETECTING CIRCUIT, LIGHT AMOUNT DETECTING DEVICE, AND...
- Publication number 20150153223
- Publication date Jun 4, 2015
- Fujio Onishi
- G01 - MEASURING TESTING