Hiroshi Tsukada

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Modeling method
- Patent number 12,124,786
- Issue date Oct 22, 2024
- Kioxia Corporation
- Shimpei Miura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and method for inspecting line width and/or posit...
- Patent number 9,406,117
- Issue date Aug 2, 2016
- NuFlare Technology, Inc.
- Takanao Touya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for inspecting line width and/or posit...
- Patent number 9,036,896
- Issue date May 19, 2015
- Nuflare Technology, Inc.
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 8,761,518
- Issue date Jun 24, 2014
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODELING METHOD
- Publication number 20220302102
- Publication date Sep 22, 2022
- KIOXIA Corporation
- Shimpei MIURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
- Publication number 20150193918
- Publication date Jul 9, 2015
- NuFlare Technology, Inc.
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20120020546
- Publication date Jan 26, 2012
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
- Publication number 20110255770
- Publication date Oct 20, 2011
- Kabushiki Kaisha Toshiba
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING