Hiroshi Uchihara

Person

Minami-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample analyzing apparatus
- Patent number 12,111,254
- Issue date Oct 8, 2024
- Horiba, Ltd.
- Takahito Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Quadrupole mass spectrometer, quadrupole mass spectrometry method,...
- Patent number 11,270,878
- Issue date Mar 8, 2022
- Horiba Stec, Co., Ltd.
- Kohei Sasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Element analysis device and element analysis method
- Patent number 10,978,285
- Issue date Apr 13, 2021
- Horiba, Ltd.
- Takahito Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Degree-of-dispersion determination method for single-walled carbon...
- Patent number 8,102,524
- Issue date Jan 24, 2012
- Horiba, Ltd.
- Yasushi Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Contained oxygen analyzing apparatus and contained analyzing method
- Patent number 7,387,764
- Issue date Jun 17, 2008
- Horiba, Ltd.
- Hiroshi Uchihara
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analyzing particulate matter in gas and ap...
- Patent number 6,516,654
- Issue date Feb 11, 2003
- Horiba, Ltd.
- Hiroshi Uchihara
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring oxygen in silicon
- Patent number 4,800,747
- Issue date Jan 31, 1989
- Horiba, Ltd.
- Katsuya Tsuji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELEMENT ANALYSIS METHOD, ELEMENT ANALYSIS DEVICE, AND NON-TRANSITOR...
- Publication number 20230221291
- Publication date Jul 13, 2023
- HORIBA, LTD.
- Takahito INOUE
- G01 - MEASURING TESTING
Information Patent Application
ELEMENTAL ANALYSIS DEVICE
- Publication number 20230221292
- Publication date Jul 13, 2023
- HORIBA, LTD.
- Takahito INOUE
- G01 - MEASURING TESTING
Information Patent Application
ELEMENT ANALYSIS DEVICE, MOUNTING JIG, AND MOUNTING METHOD
- Publication number 20230213419
- Publication date Jul 6, 2023
- HORIBA, LTD.
- Takahito INOUE
- G01 - MEASURING TESTING
Information Patent Application
ELEMENTAL ANALYSIS DEVICE, METHOD FOR OPERATING ELEMENTAL ANALYSIS...
- Publication number 20230204550
- Publication date Jun 29, 2023
- HORIBA, LTD.
- Takahito INOUE
- G01 - MEASURING TESTING
Information Patent Application
ELEMENTAL ANALYSIS DEVICE
- Publication number 20230098544
- Publication date Mar 30, 2023
- HORIBA, LTD.
- Takahito INOUE
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZING APPARATUS
- Publication number 20220244176
- Publication date Aug 4, 2022
- HORIBA, LTD.
- Takahito INOUE
- G01 - MEASURING TESTING
Information Patent Application
ELEMENT ANALYSIS DEVICE AND ELEMENT ANALYSIS METHOD
- Publication number 20210318267
- Publication date Oct 14, 2021
- HORIBA, LTD.
- Takahito INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUADRUPOLE MASS SPECTROMETER, QUADRUPOLE MASS SPECTROMETRY METHOD,...
- Publication number 20210166932
- Publication date Jun 3, 2021
- Horiba Stec, Co., Ltd.
- Kohei SASAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELEMENT ANALYSIS DEVICE AND ELEMENT ANALYSIS METHOD
- Publication number 20190206667
- Publication date Jul 4, 2019
- HORIBA, LTD.
- Takahito INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEGREE-OF-DISPERSION DETERMINATION METHOD FOR SINGLE-WALLED CARBON...
- Publication number 20100110421
- Publication date May 6, 2010
- Yasushi NAKATA
- G01 - MEASURING TESTING
Information Patent Application
Concentration method and apparatus of preparing a liquid specimen f...
- Publication number 20050239211
- Publication date Oct 27, 2005
- Hiroshi Uchihara
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Contained oxygen analyzing apparatus and contained analyzing method
- Publication number 20040014234
- Publication date Jan 22, 2004
- Hiroshi Uchihara
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for analyzing particulate matter in gas and ap...
- Publication number 20010029775
- Publication date Oct 18, 2001
- Hiroshi Uchihara
- G01 - MEASURING TESTING

Hiroshi Uchihara

Person

Patents Grantslast 30 patents

Sample analyzing apparatus

Quadrupole mass spectrometer, quadrupole mass spectrometry method,...

Element analysis device and element analysis method

Degree-of-dispersion determination method for single-walled carbon...

Contained oxygen analyzing apparatus and contained analyzing method

Apparatus and method for analyzing particulate matter in gas and ap...

Method of measuring oxygen in silicon

Patents Applicationslast 30 patents

ELEMENT ANALYSIS METHOD, ELEMENT ANALYSIS DEVICE, AND NON-TRANSITOR...

ELEMENTAL ANALYSIS DEVICE

ELEMENT ANALYSIS DEVICE, MOUNTING JIG, AND MOUNTING METHOD

ELEMENTAL ANALYSIS DEVICE, METHOD FOR OPERATING ELEMENTAL ANALYSIS...

ELEMENTAL ANALYSIS DEVICE

SAMPLE ANALYZING APPARATUS

ELEMENT ANALYSIS DEVICE AND ELEMENT ANALYSIS METHOD

QUADRUPOLE MASS SPECTROMETER, QUADRUPOLE MASS SPECTROMETRY METHOD,...

ELEMENT ANALYSIS DEVICE AND ELEMENT ANALYSIS METHOD

DEGREE-OF-DISPERSION DETERMINATION METHOD FOR SINGLE-WALLED CARBON...

Concentration method and apparatus of preparing a liquid specimen f...

Contained oxygen analyzing apparatus and contained analyzing method

Apparatus and method for analyzing particulate matter in gas and ap...