Hiroshi Yanagita

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Koganei, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defective product inspection apparatus, probe positioning method an...
- Patent number 8,074,293
- Issue date Dec 6, 2011
- Hitachi High-Technologies Corporation
- Eiichi Hazaki
- G01 - MEASURING TESTING
Information Patent Grant
Defective product inspection apparatus, probe positioning method an...
- Patent number 7,553,334
- Issue date Jun 30, 2009
- Hitachi High-Technologies Corporation
- Eiichi Hazaki
- G01 - MEASURING TESTING
Information Patent Grant
Defective product inspection apparatus, probe positioning method an...
- Patent number 7,297,945
- Issue date Nov 20, 2007
- Hitachi High-Technologies Corporation
- Eiichi Hazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECTIVE PRODUCT INSPECTION APPARATUS, PROBE POSITIONING METHOD AN...
- Publication number 20090230984
- Publication date Sep 17, 2009
- Hitachi High-Technologies Corporation
- Eiichi Hazaki
- G01 - MEASURING TESTING
Information Patent Application
Defective product inspection apparatus, probe positioning method an...
- Publication number 20080048699
- Publication date Feb 28, 2008
- Hitachi High-Technologies Corporation
- Eiichi Hazaki
- G01 - MEASURING TESTING
Information Patent Application
Defective product inspection apparatus, probe positioning method an...
- Publication number 20050139781
- Publication date Jun 30, 2005
- Eiichi Hazaki
- G01 - MEASURING TESTING