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Phased-array radar
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Patent number 4,942,403
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Issue date Jul 17, 1990
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NEC Corporation
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Hiroshi Yokoyama
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G01 - MEASURING TESTING
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Radar system
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Patent number 4,658,257
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Issue date Apr 14, 1987
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NEC Corporation
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Toshiyuki Izutani
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G01 - MEASURING TESTING
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High-speed pattern generator
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Patent number 4,389,723
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Issue date Jun 21, 1983
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Nippon Electric Co., Ltd.
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Atsushi Nigorikawa
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G01 - MEASURING TESTING