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Hiroshige Mori
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Hamamatsu-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray inspection system
Patent number
7,356,117
Issue date
Apr 8, 2008
Hamamatsu Photonics K.K.
Makoto Suzuki
G01 - MEASURING TESTING
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Patent Grant
X-ray inspection system
Patent number
6,876,722
Issue date
Apr 5, 2005
Hamamatsu Photonics K.K.
Makoto Suzuki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-ray inspection system
Publication number
20050100130
Publication date
May 12, 2005
Hamamatsu Photonics K.K.
Makoto Suzuki
G01 - MEASURING TESTING
Information
Patent Application
X-ray inspection system
Publication number
20030142784
Publication date
Jul 31, 2003
Makoto Suzuki
G01 - MEASURING TESTING