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Hiroshige Sugito
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Nagoya, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor sensor device and method of manufacturing the same
Patent number
6,444,543
Issue date
Sep 3, 2002
Denso Corporation
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method for manufacturing semiconductor dynamic quantity sensor
Patent number
6,287,885
Issue date
Sep 11, 2001
Denso Corporation
Hiroshi Muto
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor dynamical quantity sensor device having electrodes in...
Patent number
6,151,966
Issue date
Nov 28, 2000
Denso Corporation
Minekazu Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor strain sensor
Patent number
5,869,876
Issue date
Feb 9, 1999
Denso Corporation
Seiichiro Ishio
G01 - MEASURING TESTING
Information
Patent Grant
Process for producing semiconductor strain-sensitive sensor
Patent number
5,654,244
Issue date
Aug 5, 1997
Nippondenso Co., Ltd.
Minekazu Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Production method of a semiconductor dynamic sensor
Patent number
5,643,803
Issue date
Jul 1, 1997
Nippondenso Co., Ltd.
Tsuyoshi Fukada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor strain sensor having improved resistance to bonding s...
Patent number
5,408,112
Issue date
Apr 18, 1995
Nippondenso Co., Ltd.
Akira Tai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor sensor device and method of manufacturing the same
Publication number
20010055876
Publication date
Dec 27, 2001
Minekazu Sakai
B81 - MICRO-STRUCTURAL TECHNOLOGY