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Kanagawa-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
9,406,480
Issue date
Aug 2, 2016
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical inspection apparatus using electron beam
Patent number
9,390,886
Issue date
Jul 12, 2016
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
9,368,314
Issue date
Jun 14, 2016
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
8,946,631
Issue date
Feb 3, 2015
Ebara Corporation
Nobuharu Noji
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for inspecting sample surface
Patent number
8,859,984
Issue date
Oct 14, 2014
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for inspection with electron beam, method for operating s...
Patent number
8,822,919
Issue date
Sep 2, 2014
Ebara Corporation
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
8,803,103
Issue date
Aug 12, 2014
Ebara Corporation
Mamoru Nakasuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
8,742,341
Issue date
Jun 3, 2014
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting sample surface
Patent number
8,525,127
Issue date
Sep 3, 2013
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
8,368,031
Issue date
Feb 5, 2013
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
8,053,726
Issue date
Nov 8, 2011
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting sample surface
Patent number
7,952,071
Issue date
May 31, 2011
Ebara Corporation
Nobuharu Noji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for inspection with electron beam, method for operating s...
Patent number
7,928,378
Issue date
Apr 19, 2011
Ebara Corporation
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,888,642
Issue date
Feb 15, 2011
Ebara Corporation
Mamoru Nakasuji
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Electron beam apparatus and an aberration correction optical apparatus
Patent number
7,863,580
Issue date
Jan 4, 2011
Ebara Corporation
Masahiro Hatakeyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sheet beam-type testing apparatus
Patent number
7,829,871
Issue date
Nov 9, 2010
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,745,784
Issue date
Jun 29, 2010
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
7,741,601
Issue date
Jun 22, 2010
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
7,601,972
Issue date
Oct 13, 2009
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam inspection system and inspection method and method of...
Patent number
7,569,838
Issue date
Aug 4, 2009
Ebara Corporation
Kenji Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam apparatus and device production method using the elec...
Patent number
7,439,502
Issue date
Oct 21, 2008
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,423,267
Issue date
Sep 9, 2008
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Objective lens, electron beam system and method of inspecting defect
Patent number
7,420,164
Issue date
Sep 2, 2008
Ebara Corporation
Mamoru Nakasuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sheet beam-type testing apparatus
Patent number
7,417,236
Issue date
Aug 26, 2008
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for inspection with electron beam, method for operating s...
Patent number
7,408,175
Issue date
Aug 5, 2008
Ebara Corporation
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and a device manufacturing method using the...
Patent number
7,385,197
Issue date
Jun 10, 2008
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Testing apparatus using charged particles and device manufacturing...
Patent number
7,365,324
Issue date
Apr 29, 2008
Ebara Corporation
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam inspection system and inspection method and method of...
Patent number
7,351,969
Issue date
Apr 1, 2008
Ebara Corporation
Kenji Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
7,297,949
Issue date
Nov 20, 2007
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,247,848
Issue date
Jul 24, 2007
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING APPARATUS USING CHARGED PARTICLES AND DEVICE MANUFACTURING...
Publication number
20150122993
Publication date
May 7, 2015
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE INSPECTION METHOD AND A SUBSTRATE PROCESSING METHOD
Publication number
20140367570
Publication date
Dec 18, 2014
EBARA CORPORATION
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
Publication number
20140319346
Publication date
Oct 30, 2014
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
TESTING APPARATUS USING CHARGED PARTICLES AND DEVICE MANUFACTURING...
Publication number
20140158885
Publication date
Jun 12, 2014
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
Publication number
20140034831
Publication date
Feb 6, 2014
KABUSHIKI KAISHA TOSHIBA
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
Publication number
20130313429
Publication date
Nov 28, 2013
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
Publication number
20120145921
Publication date
Jun 14, 2012
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
Publication number
20120032079
Publication date
Feb 9, 2012
KABUSHIKI KAISHA TOSHIBA
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR INSPECTION WITH ELECTRON BEAM, METHOD FOR OPERATING S...
Publication number
20110104830
Publication date
May 5, 2011
EBARA CORPORATION
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Application
Testing apparatus using charged particles and device manufacturing...
Publication number
20100237243
Publication date
Sep 23, 2010
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
Electron Beam Apparatus
Publication number
20100213370
Publication date
Aug 26, 2010
Mamoru Nakasuji
G02 - OPTICS
Information
Patent Application
PROJECTION ELECTRON BEAM APPARATUS AND DEFECT INSPECTION SYSTEM USI...
Publication number
20090212213
Publication date
Aug 27, 2009
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Testing apparatus using charged particles and device manufacturing...
Publication number
20090101816
Publication date
Apr 23, 2009
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
Electron beam apparatus and method of manufacturing semiconductor d...
Publication number
20090050822
Publication date
Feb 26, 2009
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
Publication number
20090050802
Publication date
Feb 26, 2009
EBARA CORPORATION
Nobuharu Noji
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON BEAM APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR D...
Publication number
20090039262
Publication date
Feb 12, 2009
EBARA CORPORATION
Mamoru NAKASUJI
G01 - MEASURING TESTING
Information
Patent Application
Inspection system by charged particle beam and method of manufactur...
Publication number
20090032708
Publication date
Feb 5, 2009
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING SAMPLE SURFACE
Publication number
20090026368
Publication date
Jan 29, 2009
Ebara Corporation
Nobuharu Noji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM APPARATUS
Publication number
20090014649
Publication date
Jan 15, 2009
EBARA CORPORATION
Mamoru Nakasuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Objective lens, electron beam system and method of inspecting defect
Publication number
20080315090
Publication date
Dec 25, 2008
EBARA CORPORATION
Mamoru Nakasuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus for inspection with electron beam, method for operating s...
Publication number
20080308729
Publication date
Dec 18, 2008
EBARA CORPORATION
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Application
SHEET BEAM-TYPE TESTING APPARATUS
Publication number
20080302963
Publication date
Dec 11, 2008
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Electron beam apparatus and device production method using the elec...
Publication number
20080173815
Publication date
Jul 24, 2008
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Electron beam inspection system and inspection method and method of...
Publication number
20080173814
Publication date
Jul 24, 2008
EBARA CORPORATION
Kenji Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for inspecting substrate, substrate inspecting system and el...
Publication number
20080121804
Publication date
May 29, 2008
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON BEAM APPARATUS AND AN ABERRATION CORRECTION OPTICAL APPARATUS
Publication number
20080067377
Publication date
Mar 20, 2008
EBARA CORPORATION
Masahiro Hatakeyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Inspection system by charged particle beam and method of manufactur...
Publication number
20080042060
Publication date
Feb 21, 2008
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Electron beam apparatus and device production method using the elec...
Publication number
20070272859
Publication date
Nov 29, 2007
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for inspection with electron beam, method for operating s...
Publication number
20070194235
Publication date
Aug 23, 2007
EBARA CORPORATION
Toshifumi Kimba
G01 - MEASURING TESTING
Information
Patent Application
Inspection system by charged particle beam and method of manufactur...
Publication number
20070057186
Publication date
Mar 15, 2007
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING