Hirotaka HOSOI

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Sapporo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Biosensor having ultra fine fiber
- Patent number 8,072,008
- Issue date Dec 6, 2011
- Mitsumi Electric Co., Ltd.
- Koichi Mukasa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Single-electron transistor, field-effect transistor, sensor, method...
- Patent number 7,935,989
- Issue date May 3, 2011
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe having at least one magnetic resistive element for measuring...
- Patent number 6,717,402
- Issue date Apr 6, 2004
- Hokkaido University
- Koichi Mukasa
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscope
- Patent number 6,655,196
- Issue date Dec 2, 2003
- Hokkaido University
- Koichi Mukasa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Sensing a Substance to be Detected in a Sample
- Publication number 20110183438
- Publication date Jul 28, 2011
- Japan Science and Technology Agency
- Kazuhiko MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
Carbon Nanotube Electric Field Effect Transistor and Process for Pr...
- Publication number 20100032653
- Publication date Feb 11, 2010
- National University Corpration Hokkaido University
- Seiji Takeda
- B82 - NANO-TECHNOLOGY
Information Patent Application
FIELD EFFECT TRANSISTOR, BIOSENSOR PROVIDED WITH IT, AND DETECTING...
- Publication number 20080283875
- Publication date Nov 20, 2008
- MITSUMI ELECTRIC CO., LTD.
- Koichi MUKASA
- G01 - MEASURING TESTING
Information Patent Application
Single-electron transistor, field-effect transistor, sensor, method...
- Publication number 20060273356
- Publication date Dec 7, 2006
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20030010099
- Publication date Jan 16, 2003
- HOKKAIDO UNIVERSITY
- Koichi Mukasa
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe for measuring leakage magnetic field
- Publication number 20020121897
- Publication date Sep 5, 2002
- Koichi Mukasa
- G01 - MEASURING TESTING