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Hirotaka UEMURA

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  • Chiba-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 11,482,665
    • Issue date Oct 25, 2022
    • ABLIC INC.
    • Yohei Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Magnetic sensor
    • Patent number 11,422,208
    • Issue date Aug 23, 2022
    • ABLIC INC.
    • Hirotaka Uemura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,367,831
    • Issue date Jun 21, 2022
    • ABLIC INC.
    • Yohei Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Magnetic sensor and magnetic detection method
    • Patent number 11,340,318
    • Issue date May 24, 2022
    • ABLIC INC.
    • Hirotaka Uemura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Magnetic substance detection sensor
    • Patent number 11,326,901
    • Issue date May 10, 2022
    • ABLIC INC.
    • Hirotaka Uemura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,165,014
    • Issue date Nov 2, 2021
    • ABLIC INC.
    • Yohei Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,099,244
    • Issue date Aug 24, 2021
    • ABLIC INC.
    • Takaaki Hioka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic substance detection sensor
    • Patent number 11,035,910
    • Issue date Jun 15, 2021
    • ABLIC INC.
    • Hirotaka Uemura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    MAGNETIC SENSOR AND MAGNETIC DETECTION METHOD
    • Publication number 20210270915
    • Publication date Sep 2, 2021
    • ABLIC Inc.
    • Hirotaka UEMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SUBSTANCE DETECTION SENSOR
    • Publication number 20210080289
    • Publication date Mar 18, 2021
    • ABLIC Inc.
    • Hirotaka UEMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SUBSTANCE DETECTION SENSOR
    • Publication number 20200309983
    • Publication date Oct 1, 2020
    • ABLIC Inc.
    • Hirotaka UEMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200313079
    • Publication date Oct 1, 2020
    • ABLIC, Inc.
    • Yohei OGAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200313081
    • Publication date Oct 1, 2020
    • ABLIC Inc.
    • Yohei OGAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200313080
    • Publication date Oct 1, 2020
    • ABLIC Inc.
    • Yohei OGAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SUBSTANCE DETECTION SENSOR
    • Publication number 20200309868
    • Publication date Oct 1, 2020
    • ABLIC Inc.
    • Hirotaka UEMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20200166587
    • Publication date May 28, 2020
    • ABLIC Inc.
    • Hirotaka UEMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200011942
    • Publication date Jan 9, 2020
    • ABLIC Inc.
    • Takaaki HIOKA
    • G01 - MEASURING TESTING