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Hirotaka Wagata
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Connector and semiconductor testing device having the same
Patent number
9,583,854
Issue date
Feb 28, 2017
Molex Japan Co., Ltd.
Ryo Uesaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connector and semiconductor test device
Patent number
8,657,625
Issue date
Feb 25, 2014
Molex Japan Co., Ltd.
Hirotaka Wagata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connector and semiconductor testing device using the same
Patent number
8,558,568
Issue date
Oct 15, 2013
Molex Japan Co., Ltd.
Ryo Uesaka
G01 - MEASURING TESTING
Information
Patent Grant
Multi-port analysis apparatus and method and calibration method the...
Patent number
7,359,814
Issue date
Apr 15, 2008
Advantest
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Multi-port device analysis apparatus and method and calibration met...
Patent number
6,421,624
Issue date
Jul 16, 2002
Advantest Corp.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONNECTOR AND SEMICONDUCTOR TEST DEVICE
Publication number
20130189866
Publication date
Jul 25, 2013
Advantest Corporation
Hirotaka Wagata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Connector And Semiconductor Testing Device Using The Same
Publication number
20110285415
Publication date
Nov 24, 2011
Advantest Corporation
Ryo Uesaka
G01 - MEASURING TESTING
Information
Patent Application
Connector And Semiconductor Testing Device Having The Same
Publication number
20110279140
Publication date
Nov 17, 2011
Advantest Corporation
Ryo Uesaka
G01 - MEASURING TESTING