Hirotami Koike

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam reflector device and electron microscope
- Patent number 7,902,504
- Issue date Mar 8, 2011
- Kabushiki Kaisha Topcon
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,592,604
- Issue date Sep 22, 2009
- Topcon Corporation
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam system and electron beam measuring and observing methods
- Patent number 7,329,867
- Issue date Feb 12, 2008
- Topcon Corporation
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam system and electron beam measuring and observing methods
- Patent number 7,151,258
- Issue date Dec 19, 2006
- Topcon Corporation
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,894,277
- Issue date May 17, 2005
- Kabushiki Kaisha Topcon
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and method for stereoscopic measurements
- Patent number 6,852,974
- Issue date Feb 8, 2005
- Topcon Corporation
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope system
- Patent number 6,717,144
- Issue date Apr 6, 2004
- Kabushiki Kaisha Topcon
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,642,520
- Issue date Nov 4, 2003
- Kabushiki Kaisha Topcon
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Organic substance analyzer
- Patent number 6,201,241
- Issue date Mar 13, 2001
- Kabushiki Kaisha Topcon
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for displaying a sample image
- Patent number 5,393,976
- Issue date Feb 28, 1995
- Kabushiki Kaisha Topcon
- Hirotami Koike
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for morphological observation of a sample
- Patent number 5,382,796
- Issue date Jan 17, 1995
- Kabushiki Kaisha Topcon
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope of a scanning type
- Patent number 4,458,151
- Issue date Jul 3, 1984
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope of scanning type
- Patent number 4,426,577
- Issue date Jan 17, 1984
- International Precision Incorporated
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning electron microscope and similar apparatus
- Publication number 20090294665
- Publication date Dec 3, 2009
- Hirotami Koike
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam reflector device and electron microscope
- Publication number 20090095904
- Publication date Apr 16, 2009
- Kabushiki Kaisha TOPCON
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYZING APPARATUS
- Publication number 20080121799
- Publication date May 29, 2008
- Chohei Kanno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20070246651
- Publication date Oct 25, 2007
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam system and electron beam measuring and observing methods
- Publication number 20060289757
- Publication date Dec 28, 2006
- TOPCON CORPORATION
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope and similar apparatus
- Publication number 20050279937
- Publication date Dec 22, 2005
- Hirotami Koike
- G01 - MEASURING TESTING
Information Patent Application
Electron beam system and electron beam measuring and observing methods
- Publication number 20050061972
- Publication date Mar 24, 2005
- TOPCON CORPORATION
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam device and method for stereoscopic measurements
- Publication number 20050040332
- Publication date Feb 24, 2005
- TOPCON CORPORATION
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20040011959
- Publication date Jan 22, 2004
- KABUSHIKI KAISHA TOPCON
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope system
- Publication number 20030102430
- Publication date Jun 5, 2003
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20020185599
- Publication date Dec 12, 2002
- Kabushiki Kaisha TOPCON
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam device and method for stereoscopic measurements
- Publication number 20020179812
- Publication date Dec 5, 2002
- TOPCON CORPORATION
- Nobuo Kochi
- H01 - BASIC ELECTRIC ELEMENTS

Hirotami Koike

Person

Patents Grantslast 30 patents

Charged particle beam reflector device and electron microscope

Charged particle beam apparatus

Electron beam system and electron beam measuring and observing methods

Electron beam system and electron beam measuring and observing methods

Scanning electron microscope

Electron beam device and method for stereoscopic measurements

Scanning electron microscope system

Scanning electron microscope

Organic substance analyzer

Apparatus for displaying a sample image

Apparatus for morphological observation of a sample

Electron microscope of a scanning type

Electron microscope of scanning type

Patents Applicationslast 30 patents

Scanning electron microscope and similar apparatus

Charged particle beam reflector device and electron microscope

SAMPLE ANALYZING APPARATUS

Charged particle beam apparatus

Electron beam system and electron beam measuring and observing methods

Scanning electron microscope and similar apparatus

Electron beam system and electron beam measuring and observing methods

Electron beam device and method for stereoscopic measurements

Scanning electron microscope

Scanning electron microscope system

Scanning electron microscope

Electron beam device and method for stereoscopic measurements