Hiroto Fukuhisa

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device, pattern detection method a...
- Patent number 7,924,185
- Issue date Apr 12, 2011
- Kabushiki Kaisha Toshiba
- Hiroto Fukuhisa
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-repairing semiconductor device having a testing unit for testi...
- Patent number 6,718,496
- Issue date Apr 6, 2004
- Kabushiki Kaisha Toshiba
- Hiroto Fukuhisa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, PATTERN DETECTION METHOD A...
- Publication number 20090096644
- Publication date Apr 16, 2009
- Kabushiki Kaisha Toshiba
- Hiroto Fukuhisa
- H03 - BASIC ELECTRONIC CIRCUITRY