Hiroto Kasai

Person

Higashimatsuyama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Micro flow channel chip
- Patent number D960740
- Issue date Aug 16, 2022
- Sony Corporation
- Yuji Akiyama
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Micro flow channel chip
- Patent number D907242
- Issue date Jan 5, 2021
- Sony Corporation
- Masataka Shinoda
- D24 - Medical and laboratory equipment
Information Patent Grant
Electron microscope and imaging method
- Patent number 10,535,497
- Issue date Jan 14, 2020
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro flow channel chip
- Patent number D869308
- Issue date Dec 10, 2019
- Sony Corporation
- Yuji Akiyama
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Particle sorting apparatus and particle sorting method
- Patent number 10,451,534
- Issue date Oct 22, 2019
- Sony Corporation
- Fumitaka Otsuka
- G01 - MEASURING TESTING
Information Patent Grant
Particle sorting apparatus, particle sorting method, and non-transi...
- Patent number 9,804,075
- Issue date Oct 31, 2017
- Sony Corporation
- Fumitaka Otsuka
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Micro flow channel chip for a flow cytometer
- Patent number D795724
- Issue date Aug 29, 2017
- Sony Corporation
- Yuji Akiyama
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Micro flow channel chip for flow cytometer
- Patent number D757580
- Issue date May 31, 2016
- Sony Corporation
- Yuji Akiyama
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Phase plate and electron microscope
- Patent number 9,208,990
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam interference device and electron beam interferometry
- Patent number 8,946,628
- Issue date Feb 3, 2015
- Hitachi, Ltd.
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam observation device using pre-specimen magnetic field...
- Patent number 7,939,801
- Issue date May 10, 2011
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 7,923,685
- Issue date Apr 12, 2011
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron holography system
- Patent number 7,791,023
- Issue date Sep 7, 2010
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 7,319,225
- Issue date Jan 15, 2008
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS device and methods for manufacturing thereof, light modulation...
- Patent number 7,102,808
- Issue date Sep 5, 2006
- Sony Corporation
- Hiroto Kasai
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MICROCHIP AND MICROPARTICLE MEASURING APPARATUS
- Publication number 20230063086
- Publication date Mar 2, 2023
- SONY GROUP CORPORATION
- Hiroto Kasai
- G01 - MEASURING TESTING
Information Patent Application
MICROCHIP AND MICROPARTICLE MEASURING APPARATUS
- Publication number 20200070152
- Publication date Mar 5, 2020
- SONY CORPORATION
- Hiroto Kasai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ELECTRON MICROSCOPE AND IMAGING METHOD
- Publication number 20190131107
- Publication date May 2, 2019
- Hitachi High-Technologies Corporation
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE SORTING APPARATUS, PARTICLE SORTING METHOD, AND NON-TRANSI...
- Publication number 20180045638
- Publication date Feb 15, 2018
- SONY CORPORATION
- FUMITAKA OTSUKA
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
PARTICLE SORTING APPARATUS, PARTICLE SORTING METHOD, AND NON-TRANSI...
- Publication number 20170010203
- Publication date Jan 12, 2017
- SONY CORPORATION
- FUMITAKA OTSUKA
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Electron Beam Interference Device and Electron Beam Interferometry
- Publication number 20140332684
- Publication date Nov 13, 2014
- Hitachi, Ltd
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
PHASE PLATE AND ELECTRON MICROSCOPE
- Publication number 20140224988
- Publication date Aug 14, 2014
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEAT TRANSPORTATION DEVICE PRODUCTION METHOD AND HEAT TRANSPORTATIO...
- Publication number 20110253345
- Publication date Oct 20, 2011
- SONY CHEMICAL & INFORMATION DEVICE CORPORATION
- Hiroyuki Ryoson
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME, AND SENSOR DEVICE
- Publication number 20110157446
- Publication date Jun 30, 2011
- SONY CORPORATION
- Hiroto Kasai
- G01 - MEASURING TESTING
Information Patent Application
HEAT TRANSPORT DEVICE MANUFACTURING METHOD AND HEAT TRANSPORT DEVICE
- Publication number 20110005724
- Publication date Jan 13, 2011
- SONY CORPORATION
- Hiroto Kasai
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HEAT TRANSPORT DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20100307722
- Publication date Dec 9, 2010
- SONY CORPORATION
- Hiroyuki Ryoson
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
HEAT TRANSPORT DEVICE, ELECTRONIC APPARATUS, AND HEAT TRANSPORT MAN...
- Publication number 20100252237
- Publication date Oct 7, 2010
- SONY CORPORATION
- Mitsuo Hashimoto
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20090206256
- Publication date Aug 20, 2009
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM OBSERVATION DEVICE USING PRE-SPECIMEN MAGNETIC FIELD...
- Publication number 20090206258
- Publication date Aug 20, 2009
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Holography Observation Apparatus
- Publication number 20080067375
- Publication date Mar 20, 2008
- Hiroto Kasai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Transmission electron microscope
- Publication number 20060255273
- Publication date Nov 16, 2006
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mems device and methods for manufacturing thereof, light modulation...
- Publication number 20040150869
- Publication date Aug 5, 2004
- Hiroto Kasai
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Hiroto Kasai

Person

Patents Grantslast 30 patents

Micro flow channel chip

Micro flow channel chip

Electron microscope and imaging method

Micro flow channel chip

Particle sorting apparatus and particle sorting method

Particle sorting apparatus, particle sorting method, and non-transi...

Micro flow channel chip for a flow cytometer

Micro flow channel chip for flow cytometer

Phase plate and electron microscope

Electron beam interference device and electron beam interferometry

Electron beam observation device using pre-specimen magnetic field...

Electron beam device

Electron holography system

Transmission electron microscope

MEMS device and methods for manufacturing thereof, light modulation...

Patents Applicationslast 30 patents

MICROCHIP AND MICROPARTICLE MEASURING APPARATUS

MICROCHIP AND MICROPARTICLE MEASURING APPARATUS

ELECTRON MICROSCOPE AND IMAGING METHOD

PARTICLE SORTING APPARATUS, PARTICLE SORTING METHOD, AND NON-TRANSI...

PARTICLE SORTING APPARATUS, PARTICLE SORTING METHOD, AND NON-TRANSI...

Electron Beam Interference Device and Electron Beam Interferometry

PHASE PLATE AND ELECTRON MICROSCOPE

HEAT TRANSPORTATION DEVICE PRODUCTION METHOD AND HEAT TRANSPORTATIO...

IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME, AND SENSOR DEVICE

HEAT TRANSPORT DEVICE MANUFACTURING METHOD AND HEAT TRANSPORT DEVICE

HEAT TRANSPORT DEVICE AND METHOD FOR MANUFACTURING THE SAME

HEAT TRANSPORT DEVICE, ELECTRONIC APPARATUS, AND HEAT TRANSPORT MAN...

ELECTRON BEAM DEVICE

ELECTRON BEAM OBSERVATION DEVICE USING PRE-SPECIMEN MAGNETIC FIELD...

Electron Beam Holography Observation Apparatus

Transmission electron microscope

Mems device and methods for manufacturing thereof, light modulation...