Hiroto Matsubayashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card, semiconductor measuring device, and semiconductor measu...
- Patent number 11,215,639
- Issue date Jan 4, 2022
- Mitsubishi Electric Corporation
- Hiroto Matsubayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor element
- Patent number 5,905,384
- Issue date May 18, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Akira Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor element evaluating apparatus
- Patent number 5,801,528
- Issue date Sep 1, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device and fabricating thereof
- Patent number 5,786,627
- Issue date Jul 28, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Akira Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device
- Patent number 5,675,184
- Issue date Oct 7, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Hiroto Matsubayashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Film carrier signal transmission line having separating grooves
- Patent number 5,426,399
- Issue date Jun 20, 1995
- Hiroto Matsubayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monolithic integrated circuit including gate bias transistor contro...
- Patent number 5,412,235
- Issue date May 2, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Yasuharu Nakajima
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD, SEMICONDUCTOR MEASURING DEVICE, AND SEMICONDUCTOR MEASU...
- Publication number 20210140998
- Publication date May 13, 2021
- Mitsubishi Electric Corporation
- Hiroto MATSUBAYASHI
- G01 - MEASURING TESTING

Hiroto Matsubayashi

Person

Patents Grantslast 30 patents

Probe card, semiconductor measuring device, and semiconductor measu...

Method for testing semiconductor element

Semiconductor element evaluating apparatus

Integrated circuit device and fabricating thereof

Integrated circuit device

Film carrier signal transmission line having separating grooves

Monolithic integrated circuit including gate bias transistor contro...

Patents Applicationslast 30 patents

PROBE CARD, SEMICONDUCTOR MEASURING DEVICE, AND SEMICONDUCTOR MEASU...