Hiroto Nakamura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 8,941,729
- Issue date Jan 27, 2015
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method of electronic device test apparatus
- Patent number 8,294,759
- Issue date Oct 23, 2012
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device testing apparatus
- Patent number 7,459,902
- Issue date Dec 2, 2008
- Advantest Corporation
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Insert attachable to an insert magazine of a tray for holding an ar...
- Patent number 7,371,078
- Issue date May 13, 2008
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Cooling fin connected to a cooling unit and a pusher of the testing...
- Patent number 7,362,117
- Issue date Apr 22, 2008
- Advantest Corporation
- Noboru Saito
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing socket and electronic component testin...
- Patent number 6,932,635
- Issue date Aug 23, 2005
- Advantest Corporation
- Takaji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Cooling fin connected to a cooling unit and a pusher of the testing...
- Patent number 6,919,734
- Issue date Jul 19, 2005
- Advantest Corporation
- Noboru Saito
- G01 - MEASURING TESTING
Information Patent Grant
Electric device testing apparatus
- Patent number 6,445,203
- Issue date Sep 3, 2002
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,384,593
- Issue date May 7, 2002
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
IC receiving tray storage device and mounting apparatus for the same
- Patent number 6,354,792
- Issue date Mar 12, 2002
- Advantest Corporation
- Yoshito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device tray electronic device tray, transporting apparat...
- Patent number 6,339,321
- Issue date Jan 15, 2002
- Advantest Corporation
- Kazuyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
IC testing apparatus
- Patent number 6,248,967
- Issue date Jun 19, 2001
- Advantest Corporation
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus having presence or absence d...
- Patent number 6,111,246
- Issue date Aug 29, 2000
- Advantest Corporation
- Yutaka Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,104,183
- Issue date Aug 15, 2000
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Device transfer and reinspection method for IC handler
- Patent number 6,075,216
- Issue date Jun 13, 2000
- Advantest Corp.
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Test tray positioning stopper mechanism for automatic handler
- Patent number 5,973,493
- Issue date Oct 26, 1999
- Advantest Corp.
- Hiroto Nakamura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for removing and storing semiconductor device trays
- Patent number 5,906,472
- Issue date May 25, 1999
- Advantest Corporation
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Device transfer apparatus and device reinspection method for IC han...
- Patent number 5,772,387
- Issue date Jun 30, 1998
- Advantest Corp.
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Test tray positioning stopper mechanism for automatic handler
- Patent number 5,625,287
- Issue date Apr 29, 1997
- Advantest Corporation
- Hiroto Nakamura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Rail for conveying integrated circuits with J-shaped leads
- Patent number 5,269,401
- Issue date Dec 14, 1993
- Advantest Corporation
- Akihiko Ito
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
IC test equipment having a horizontally movable chuck carrier
- Patent number 5,177,434
- Issue date Jan 5, 1993
- Advantest Corporation
- Kempei Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THERMOELECTRIC DEVICE
- Publication number 20240147861
- Publication date May 2, 2024
- THE UNIVERSITY OF TOKYO
- Satoru Nakatsuji
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20110254945
- Publication date Oct 20, 2011
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD OF ELECTRONIC DEVICE TEST APPARATUS
- Publication number 20090278926
- Publication date Nov 12, 2009
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Cooling fin connected to a cooling unit and a pusher of the testing...
- Publication number 20060255822
- Publication date Nov 16, 2006
- Noboru Saito
- G01 - MEASURING TESTING
Information Patent Application
Electronic device handling apparatus and temperature application me...
- Publication number 20060104692
- Publication date May 18, 2006
- Advantest Corporation
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Application
Electronic component test apparatus
- Publication number 20050237071
- Publication date Oct 27, 2005
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
Cooling fin connected to a cooling unit and a pusher of the testing...
- Publication number 20050225346
- Publication date Oct 13, 2005
- Advantest Corporation
- Noboru Saito
- G01 - MEASURING TESTING
Information Patent Application
Electronic device testing apparatus
- Publication number 20050162150
- Publication date Jul 28, 2005
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Application
Insert and electronic component handling apparatus comprising the same
- Publication number 20050036275
- Publication date Feb 17, 2005
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
Electronic component testing socket and electronic component testin...
- Publication number 20040077200
- Publication date Apr 22, 2004
- Takaji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Device testing apparatus
- Publication number 20040070416
- Publication date Apr 15, 2004
- Advantest Corporation
- Noboru Saito
- G01 - MEASURING TESTING
Information Patent Application
Device testing apparatus
- Publication number 20020109518
- Publication date Aug 15, 2002
- Advantest Corporation
- Noboru Saito
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and semiconductor device tes...
- Publication number 20020036161
- Publication date Mar 28, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING

Hiroto Nakamura

Person

Patents Grantslast 30 patents

Electronic component handling apparatus, electronic component testi...

Calibration method of electronic device test apparatus

Electronic device testing apparatus

Insert attachable to an insert magazine of a tray for holding an ar...

Cooling fin connected to a cooling unit and a pusher of the testing...

Electronic component testing socket and electronic component testin...

Cooling fin connected to a cooling unit and a pusher of the testing...

Electric device testing apparatus

Semiconductor device testing apparatus

IC receiving tray storage device and mounting apparatus for the same

Electronic device tray electronic device tray, transporting apparat...

IC testing apparatus

Semiconductor device testing apparatus having presence or absence d...

Semiconductor device testing apparatus

Device transfer and reinspection method for IC handler

Test tray positioning stopper mechanism for automatic handler

Apparatus for removing and storing semiconductor device trays

Device transfer apparatus and device reinspection method for IC han...

Test tray positioning stopper mechanism for automatic handler

Rail for conveying integrated circuits with J-shaped leads

IC test equipment having a horizontally movable chuck carrier

Patents Applicationslast 30 patents

THERMOELECTRIC DEVICE

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

CALIBRATION METHOD OF ELECTRONIC DEVICE TEST APPARATUS

Cooling fin connected to a cooling unit and a pusher of the testing...

Electronic device handling apparatus and temperature application me...

Electronic component test apparatus

Cooling fin connected to a cooling unit and a pusher of the testing...

Electronic device testing apparatus

Insert and electronic component handling apparatus comprising the same

Electronic component testing socket and electronic component testin...

Device testing apparatus

Device testing apparatus

Semiconductor device testing apparatus and semiconductor device tes...