Hiroto Toba

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for adjusting a position of a solid-state image detector in...
- Patent number 5,909,027
- Issue date Jun 1, 1999
- Matsushita Electric Industrial Co., Ltd.
- Kouji Ohura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for adjusting a position of a solid-state image detector in...
- Patent number 5,805,218
- Issue date Sep 8, 1998
- Matsushita Electric Industrial Co., Ltd.
- Kouji Ohura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System for optically inspecting conditions of parts packaged on sub...
- Patent number 5,200,799
- Issue date Apr 6, 1993
- Matsushita Electric Industrial Co., Ltd.
- Yuji Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting solder portion of a circuit board
- Patent number 5,103,105
- Issue date Apr 7, 1992
- Matsushita Electric Industrial Co., Ltd.
- Kazutoshi Ikegaya
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical inspection apparatus for printed-circuit boards wit...
- Patent number 5,027,418
- Issue date Jun 25, 1991
- Matsushita Electric Industrial Co., Ltd.
- Kazutoshi Ikegaya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Linescan apparatus for detecting salient pattern of a product
- Patent number 4,983,827
- Issue date Jan 8, 1991
- Matsushita Electric Industrial Co., Ltd.
- Kazutoshi Ikegaya
- G01 - MEASURING TESTING