Hirotomo YASHIMA

Follow

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection device, X-ray inspection method, and method of man...
- Patent number 10,809,208
- Issue date Oct 20, 2020
- Nikon Corporation
- Hirotomo Yashima
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection device, measurement...
- Patent number 10,809,209
- Issue date Oct 20, 2020
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement processing device, X-ray inspection device, measurement...
- Patent number 10,481,106
- Issue date Nov 19, 2019
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement processing device, X-ray inspection device, measurement...
- Patent number 10,444,165
- Issue date Oct 15, 2019
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT...
- Publication number 20200003705
- Publication date Jan 2, 2020
- Nikon Corporation
- Hirotomo YASHIMA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT...
- Publication number 20180120243
- Publication date May 3, 2018
- Nikon Corporation
- Hirotomo YASHIMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE, X-RAY INSPECTION METHOD, AND METHOD OF MAN...
- Publication number 20180045660
- Publication date Feb 15, 2018
- Nikon Corporation
- Hirotomo YASHIMA
- G01 - MEASURING TESTING