Hirotoshi TERADA

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning microscope unit
- Patent number 12,216,263
- Issue date Feb 4, 2025
- Hamamatsu Photonics K.K.
- Jiro Yamashita
- G02 - OPTICS
Information Patent Grant
Confocal microscope unit and confocal microscope
- Patent number 12,117,600
- Issue date Oct 15, 2024
- Hamamatsu Photonics K.K.
- Jiro Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Confocal microscope unit and confocal microscope
- Patent number 12,078,789
- Issue date Sep 3, 2024
- Hamamatsu Photonics K.K.
- Jiro Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatus examination method and semiconductor appara...
- Patent number 11,967,061
- Issue date Apr 23, 2024
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solid immersion lens unit and semiconductor inspection device
- Patent number 11,913,888
- Issue date Feb 27, 2024
- Hamamatsu Photonics K.K.
- Xiangguang Mao
- G01 - MEASURING TESTING
Information Patent Grant
Cooling unit, objective lens module, semiconductor inspection devic...
- Patent number 11,841,393
- Issue date Dec 12, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metalens unit, semiconductor fault analysis device, and semiconduct...
- Patent number 11,391,774
- Issue date Jul 19, 2022
- Hamamatsu Photonics K.K.
- Soh Uenoyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,607,900
- Issue date Mar 31, 2020
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Photostimulation device and photostimulation method
- Patent number 10,578,601
- Issue date Mar 3, 2020
- Hamamatsu Photonics K.K.
- Naoya Matsumoto
- G02 - OPTICS
Information Patent Grant
Solid immersion lens holder and image acquisition device
- Patent number 10,558,010
- Issue date Feb 11, 2020
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Grant
Solid immersion lens holder and image acquisition device
- Patent number 10,545,309
- Issue date Jan 28, 2020
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Grant
Optical module and observation device
- Patent number 10,495,896
- Issue date Dec 3, 2019
- Hamamatsu Photonics K.K.
- Takashi Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,312,166
- Issue date Jun 4, 2019
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Microscope device and image acquisition method
- Patent number 10,302,569
- Issue date May 28, 2019
- Hamamatsu Photonics K.K.
- Naoya Matsumoto
- G02 - OPTICS
Information Patent Grant
Photostimulation device and photostimulation method
- Patent number 10,073,076
- Issue date Sep 11, 2018
- Hamamatsu Photonics K.K.
- Naoya Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Microscope device and image acquisition method
- Patent number 9,891,172
- Issue date Feb 13, 2018
- Hamamatsu Photonics K.K.
- Naoya Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical module and light exposure device
- Patent number 9,784,980
- Issue date Oct 10, 2017
- Hamamatsu Photonics K.K.
- Takashi Inoue
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Suction apparatus, semiconductor device observation device, and sem...
- Patent number 8,947,776
- Issue date Feb 3, 2015
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Immersion lens holding device
- Patent number 8,619,377
- Issue date Dec 31, 2013
- Hamamatsu Photonics K.K.
- Ikuo Arata
- G02 - OPTICS
Information Patent Grant
Observing device and method
- Patent number 8,582,202
- Issue date Nov 12, 2013
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Solid immersion lens holder
- Patent number 8,094,389
- Issue date Jan 10, 2012
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis apparatus which acquires a failure o...
- Patent number 7,865,012
- Issue date Jan 4, 2011
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis apparatus, failure analysis method,...
- Patent number 7,805,691
- Issue date Sep 28, 2010
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Grant
Microscope and sample observation method
- Patent number 7,576,910
- Issue date Aug 18, 2009
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Solid immersion lens holder
- Patent number 7,576,928
- Issue date Aug 18, 2009
- Hamamatsu Photonics K.K.
- Hiroshi Tanabe
- G02 - OPTICS
Information Patent Grant
Fluorescence lifetime distribution image measuring system and its m...
- Patent number 7,453,567
- Issue date Nov 18, 2008
- Hamamatsu Photonics K.K.
- Haruhisa Saitoh
- G01 - MEASURING TESTING
Information Patent Grant
Solid immersion lens and microscope
- Patent number 7,423,816
- Issue date Sep 9, 2008
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation method, microscope, and solid immersion lens, op...
- Patent number 7,359,115
- Issue date Apr 15, 2008
- Hamamatsu Photonics K.K.
- Ikuo Arata
- G01 - MEASURING TESTING
Information Patent Grant
Microscope and sample observation method
- Patent number 7,312,921
- Issue date Dec 25, 2007
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam inspection equipment
- Patent number 7,230,436
- Issue date Jun 12, 2007
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR APPARATUS EXAMINATION METHOD AND SEMICONDUCTOR APPARA...
- Publication number 20220207710
- Publication date Jun 30, 2022
- Hamamatsu Photonics K.K.
- Hirotoshi TERADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE
- Publication number 20220179185
- Publication date Jun 9, 2022
- Hamamatsu Photonics K.K.
- Jiro YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE
- Publication number 20220155577
- Publication date May 19, 2022
- Hamamatsu Photonics K.K.
- Jiro YAMASHITA
- G02 - OPTICS
Information Patent Application
SCANNING MICROSCOPE UNIT
- Publication number 20220155576
- Publication date May 19, 2022
- Hamamatsu Photonics K.K.
- Jiro YAMASHITA
- G02 - OPTICS
Information Patent Application
COOLING UNIT, OBJECTIVE LENS MODULE, SEMICONDUCTOR INSPECTION DEVIC...
- Publication number 20220091182
- Publication date Mar 24, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID IMMERSION LENS UNIT AND SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20210333216
- Publication date Oct 28, 2021
- Hamamatsu Photonics K.K.
- Xiangguang MAO
- G01 - MEASURING TESTING
Information Patent Application
METALENS UNIT, SEMICONDUCTOR FAULT ANALYSIS DEVICE, AND SEMICONDUCT...
- Publication number 20210239752
- Publication date Aug 5, 2021
- Hamamatsu Photonics K.K.
- Soh UENOYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20190221486
- Publication date Jul 18, 2019
- HAMAMATSU PHOTONICS K. K.
- Shinsuke SUZUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL UNIT AND METHOD FOR ADJUSTING OPTICAL UNIT
- Publication number 20190137750
- Publication date May 9, 2019
- Hamamatsu Photonics K.K.
- Hirotoshi TERADA
- G02 - OPTICS
Information Patent Application
PHOTOSTIMULATION DEVICE AND PHOTOSTIMULATION METHOD
- Publication number 20190033284
- Publication date Jan 31, 2019
- HAMAMATSU PHOTONICS K. K.
- Naoya MATSUMOTO
- G02 - OPTICS
Information Patent Application
MICROSCOPE DEVICE AND IMAGE ACQUISITION METHOD
- Publication number 20180143137
- Publication date May 24, 2018
- HAMAMATSU PHOTONICS K. K.
- Naoya MATSUMOTO
- G02 - OPTICS
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20180033704
- Publication date Feb 1, 2018
- Hamamatsu Photonics K.K.
- Shinsuke SUZUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE
- Publication number 20170285296
- Publication date Oct 5, 2017
- Hamamatsu Photonics K.K.
- Hirotoshi TERADA
- G02 - OPTICS
Information Patent Application
SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE
- Publication number 20170235087
- Publication date Aug 17, 2017
- Hamamatsu Photonics K.K.
- Hirotoshi TERADA
- G02 - OPTICS
Information Patent Application
MICROSCOPE DEVICE AND IMAGE ACQUISITION METHOD
- Publication number 20170089837
- Publication date Mar 30, 2017
- Hamamatsu Photonics K.K.
- Naoya MATSUMOTO
- G02 - OPTICS
Information Patent Application
PHOTOSTIMULATION DEVICE AND PHOTOSTIMULATION METHOD
- Publication number 20170082597
- Publication date Mar 23, 2017
- Hamamatsu Photonics K.K.
- Naoya MATSUMOTO
- G02 - OPTICS
Information Patent Application
OPTICAL MODULE AND LIGHT EXPOSURE DEVICE
- Publication number 20160062128
- Publication date Mar 3, 2016
- Hamamatsu Photonics K.K.
- Takashi INOUE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL MODULE AND OBSERVATION DEVICE
- Publication number 20160054576
- Publication date Feb 25, 2016
- Hamamatsu Photonics K. K.
- Takashi INOUE
- G02 - OPTICS
Information Patent Application
IMAGE GENERATION DEVICE
- Publication number 20130120563
- Publication date May 16, 2013
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Application
IMAGE GENERATION DEVICE
- Publication number 20130100283
- Publication date Apr 25, 2013
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Application
SUCTION APPARATUS, SEMICONDUCTOR DEVICE OBSERVATION DEVICE, AND SEM...
- Publication number 20130088714
- Publication date Apr 11, 2013
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Application
IMMERSION LENS HOLDING DEVICE
- Publication number 20120113534
- Publication date May 10, 2012
- HAMAMATSU PHOTONICS K. K.
- Ikuo Arata
- G02 - OPTICS
Information Patent Application
OBSERVING DEVICE AND METHOD
- Publication number 20100202041
- Publication date Aug 12, 2010
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Application
SOLID IMMERSION LENS HOLDER
- Publication number 20100172035
- Publication date Jul 8, 2010
- HAMAMATSU PHOTONICS K. K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Application
Sample observation method, microscope, and solid immersion lens, op...
- Publication number 20080158667
- Publication date Jul 3, 2008
- Hamamatsu Photonics K.K.
- Ikuo Arata
- G02 - OPTICS
Information Patent Application
Sample observation method, microscope, and solid immersion lens; op...
- Publication number 20080137064
- Publication date Jun 12, 2008
- Hamamatsu Photonics K.K.
- Ikuo Arata
- G02 - OPTICS
Information Patent Application
Microscope and sample observation method
- Publication number 20080074739
- Publication date Mar 27, 2008
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070294053
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070292018
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070290696
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING

Hirotoshi TERADA

Person

Patents Grantslast 30 patents

Scanning microscope unit

Confocal microscope unit and confocal microscope

Confocal microscope unit and confocal microscope

Semiconductor apparatus examination method and semiconductor appara...

Solid immersion lens unit and semiconductor inspection device

Cooling unit, objective lens module, semiconductor inspection devic...

Metalens unit, semiconductor fault analysis device, and semiconduct...

Inspection system and inspection method

Photostimulation device and photostimulation method

Solid immersion lens holder and image acquisition device

Solid immersion lens holder and image acquisition device

Optical module and observation device

Inspection system and inspection method

Microscope device and image acquisition method

Photostimulation device and photostimulation method

Microscope device and image acquisition method

Optical module and light exposure device

Suction apparatus, semiconductor device observation device, and sem...

Immersion lens holding device

Observing device and method

Solid immersion lens holder

Semiconductor failure analysis apparatus which acquires a failure o...

Semiconductor failure analysis apparatus, failure analysis method,...

Microscope and sample observation method

Solid immersion lens holder

Fluorescence lifetime distribution image measuring system and its m...

Solid immersion lens and microscope

Sample observation method, microscope, and solid immersion lens, op...

Microscope and sample observation method

Laser beam inspection equipment

Patents Applicationslast 30 patents

SEMICONDUCTOR APPARATUS EXAMINATION METHOD AND SEMICONDUCTOR APPARA...

CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE

CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE

SCANNING MICROSCOPE UNIT

COOLING UNIT, OBJECTIVE LENS MODULE, SEMICONDUCTOR INSPECTION DEVIC...

SOLID IMMERSION LENS UNIT AND SEMICONDUCTOR INSPECTION DEVICE

METALENS UNIT, SEMICONDUCTOR FAULT ANALYSIS DEVICE, AND SEMICONDUCT...

INSPECTION SYSTEM AND INSPECTION METHOD

OPTICAL UNIT AND METHOD FOR ADJUSTING OPTICAL UNIT

PHOTOSTIMULATION DEVICE AND PHOTOSTIMULATION METHOD

MICROSCOPE DEVICE AND IMAGE ACQUISITION METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE

SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE

MICROSCOPE DEVICE AND IMAGE ACQUISITION METHOD

PHOTOSTIMULATION DEVICE AND PHOTOSTIMULATION METHOD

OPTICAL MODULE AND LIGHT EXPOSURE DEVICE

OPTICAL MODULE AND OBSERVATION DEVICE

IMAGE GENERATION DEVICE

IMAGE GENERATION DEVICE

SUCTION APPARATUS, SEMICONDUCTOR DEVICE OBSERVATION DEVICE, AND SEM...

IMMERSION LENS HOLDING DEVICE

OBSERVING DEVICE AND METHOD

SOLID IMMERSION LENS HOLDER

Sample observation method, microscope, and solid immersion lens, op...

Sample observation method, microscope, and solid immersion lens; op...

Microscope and sample observation method

Semiconductor failure analysis apparatus, failure analysis method,...

Semiconductor failure analysis apparatus, failure analysis method,...

Semiconductor failure analysis apparatus, failure analysis method,...