Hirotsugu INOUE

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Stress analysis device
- Patent number 12,073,549
- Issue date Aug 27, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thickness measurement method, thickness measurement device, defect...
- Patent number 11,965,735
- Issue date Apr 23, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Stress measurement method, stress measurement device, and stress me...
- Patent number 11,467,046
- Issue date Oct 11, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fatigue limit stress specification system, fatigue limit stress spe...
- Patent number 11,275,005
- Issue date Mar 15, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measurement method, thickness measurement device, defect...
- Patent number 11,054,252
- Issue date Jul 6, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20240219175
- Publication date Jul 4, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS ANALYSIS DEVICE
- Publication number 20220180502
- Publication date Jun 9, 2022
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20210364282
- Publication date Nov 25, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
STRESS MEASUREMENT METHOD, STRESS MEASUREMENT DEVICE, AND STRESS ME...
- Publication number 20190353538
- Publication date Nov 21, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FATIGUE LIMIT STRESS SPECIFICATION SYSTEM, FATIGUE LIMIT STRESS SPE...
- Publication number 20190310174
- Publication date Oct 10, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...
- Publication number 20180372487
- Publication date Dec 27, 2018
- Panasonic Intellectual Property Management Co., Ltd.
- Yousuke IRIE
- G01 - MEASURING TESTING

Hirotsugu INOUE

Person

Patents Grantslast 30 patents

Stress analysis device

Thickness measurement method, thickness measurement device, defect...

Stress measurement method, stress measurement device, and stress me...

Fatigue limit stress specification system, fatigue limit stress spe...

Thickness measurement method, thickness measurement device, defect...

Patents Applicationslast 30 patents

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...

STRESS ANALYSIS DEVICE

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...

STRESS MEASUREMENT METHOD, STRESS MEASUREMENT DEVICE, AND STRESS ME...

FATIGUE LIMIT STRESS SPECIFICATION SYSTEM, FATIGUE LIMIT STRESS SPE...

THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT...