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Hiroumi Momota
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Chiba-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Softening point measuring apparatus and thermal conductivity measur...
Patent number
8,608,373
Issue date
Dec 17, 2013
SII NanoTechnology Inc.
Kazunori Ando
G01 - MEASURING TESTING
Information
Patent Grant
Method of determining a spring constant of a cantilever and scannin...
Patent number
8,584,261
Issue date
Nov 12, 2013
SII NanoTechnology Inc.
Masafumi Watanabe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROBE SHAPE EVALUATION METHOD FOR A SCANNING PROBE MICROSCOPE
Publication number
20130180019
Publication date
Jul 11, 2013
SII NANOTECHNOLOGY INC.
Masafumi WATANABE
B82 - NANO-TECHNOLOGY
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Patent Application
METHOD OF DETERMINING A SPRING CONSTANT OF A CANTILEVER AND SCANNIN...
Publication number
20130061357
Publication date
Mar 7, 2013
Masafumi Watanabe
B82 - NANO-TECHNOLOGY
Information
Patent Application
Softening point measuring apparatus and thermal conductivity measur...
Publication number
20110038392
Publication date
Feb 17, 2011
Kazunori Ando
G01 - MEASURING TESTING