Hiroya KANO

Person

Ota, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection method, non-transitory storage medium storing op...
- Patent number 12,188,876
- Issue date Jan 7, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Processing device relating to inspection of inspection object, insp...
- Patent number 12,136,238
- Issue date Nov 5, 2024
- Kabushiki Kaisha Toshiba
- Nobukatsu Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical apparatus, optical inspection method and non-transitory sto...
- Patent number 12,123,703
- Issue date Oct 22, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging apparatus, robot hand, moving body, and LiDAR appar...
- Patent number 11,977,182
- Issue date May 7, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method, non-transitory storage medium storing op...
- Patent number 11,906,439
- Issue date Feb 20, 2024
- Kaushiki Kaisha Toshiba
- Hiroya Kano
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus
- Patent number 11,758,278
- Issue date Sep 12, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 11,693,162
- Issue date Jul 4, 2023
- Kabushiki Kaisha Toshiba
- Hiroya Kano
- G01 - MEASURING TESTING
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 11,536,652
- Issue date Dec 27, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus
- Patent number 11,415,510
- Issue date Aug 16, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G02 - OPTICS
Information Patent Grant
Optical device, information processing method, and computer program...
- Patent number 11,333,492
- Issue date May 17, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 11,297,308
- Issue date Apr 5, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical inspection apparatus
- Patent number 10,901,134
- Issue date Jan 26, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Multi-view optical system, optical apparatus, imaging apparatus, an...
- Patent number 10,904,433
- Issue date Jan 26, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Edge detection device, an edge detection method, and an object hold...
- Patent number 10,872,418
- Issue date Dec 22, 2020
- Kabushiki Kaisha Toshiba
- Hiroya Kano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 10,812,786
- Issue date Oct 20, 2020
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 10,732,102
- Issue date Aug 4, 2020
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 10,451,545
- Issue date Oct 22, 2019
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Thermal laser stimulation apparatus, method of thermally stimulatin...
- Patent number 10,359,468
- Issue date Jul 23, 2019
- TOSHIBA MEMORY CORPORATION
- Juan Felipe Torres
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...
- Publication number 20250044235
- Publication date Feb 6, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, OPTICAL INSPECTION SYSTEM, SUBJECT SURFACE IM...
- Publication number 20250014311
- Publication date Jan 9, 2025
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTIC...
- Publication number 20240319078
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...
- Publication number 20240319111
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...
- Publication number 20240319104
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT APPARATUS, AND NON-...
- Publication number 20240319486
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Kenta TAKANASHI
- G02 - OPTICS
Information Patent Application
NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSIN...
- Publication number 20240094115
- Publication date Mar 21, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL IN...
- Publication number 20240094114
- Publication date Mar 21, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING APPARATUS, PROCESSING APPARATUS, OPTICAL IMAGING ME...
- Publication number 20240077412
- Publication date Mar 7, 2024
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...
- Publication number 20240053141
- Publication date Feb 15, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230314335
- Publication date Oct 5, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230304929
- Publication date Sep 28, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20230288619
- Publication date Sep 14, 2023
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20230099653
- Publication date Mar 30, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230077793
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING DEVICE RELATING TO INSPECTION OF INSPECTION OBJECT, INSP...
- Publication number 20230071341
- Publication date Mar 9, 2023
- Kabushiki Kaisha Toshiba
- Nobukatsu Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230066704
- Publication date Mar 2, 2023
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...
- Publication number 20230062169
- Publication date Mar 2, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS
- Publication number 20220086326
- Publication date Mar 17, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL DEVICE, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM...
- Publication number 20210293537
- Publication date Sep 23, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20210131961
- Publication date May 6, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING APPARATUS, ROBOT HAND, MOVING BODY, AND LIDAR APPAR...
- Publication number 20210080543
- Publication date Mar 18, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G02 - OPTICS
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20210014476
- Publication date Jan 14, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G02 - OPTICS
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20200333247
- Publication date Oct 22, 2020
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
MULTI-VIEW OPTICAL SYSTEM, OPTICAL APPARATUS, IMAGING APPARATUS, AN...
- Publication number 20200288058
- Publication date Sep 10, 2020
- KABUSHIKI KAISHA TOSHIBA
- Hiroshi Ohno
- B63 - SHIPS OR OTHER WATERBORNE VESSELS RELATED EQUIPMENT
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20200150326
- Publication date May 14, 2020
- KABUSHIKI KAISHA TOSHIBA
- Hiroya KANO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20200088933
- Publication date Mar 19, 2020
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G07 - CHECKING-DEVICES
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20190364267
- Publication date Nov 28, 2019
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20190219501
- Publication date Jul 18, 2019
- KABUSHIKI KAISHA TOSHISBA
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20180372625
- Publication date Dec 27, 2018
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING

Hiroya KANO

Person

Patents Grantslast 30 patents

Optical inspection method, non-transitory storage medium storing op...

Processing device relating to inspection of inspection object, insp...

Optical apparatus, optical inspection method and non-transitory sto...

Optical imaging apparatus, robot hand, moving body, and LiDAR appar...

Optical inspection method, non-transitory storage medium storing op...

Optical apparatus

Optical test apparatus and optical test method

Optical test apparatus and optical test method

Optical inspection apparatus

Optical device, information processing method, and computer program...

Optical test apparatus and optical test method

Optical inspection apparatus

Multi-view optical system, optical apparatus, imaging apparatus, an...

Edge detection device, an edge detection method, and an object hold...

Optical test apparatus and optical test method

Optical test apparatus and optical test method

Optical test apparatus and optical test method

Thermal laser stimulation apparatus, method of thermally stimulatin...

Patents Applicationslast 30 patents

OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...

PROCESSING APPARATUS, OPTICAL INSPECTION SYSTEM, SUBJECT SURFACE IM...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTIC...

OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...

OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT APPARATUS, AND NON-...

NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSIN...

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL IN...

OPTICAL IMAGING APPARATUS, PROCESSING APPARATUS, OPTICAL IMAGING ME...

OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

PROCESSING DEVICE RELATING TO INSPECTION OF INSPECTION OBJECT, INSP...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...

OPTICAL APPARATUS

OPTICAL DEVICE, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM...

OPTICAL INSPECTION APPARATUS

OPTICAL IMAGING APPARATUS, ROBOT HAND, MOVING BODY, AND LIDAR APPAR...

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

MULTI-VIEW OPTICAL SYSTEM, OPTICAL APPARATUS, IMAGING APPARATUS, AN...

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

OPTICAL INSPECTION APPARATUS

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD