Membership
Tour
Register
Log in
Hiroya Kirimura
Follow
Person
Nara-ken, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method for detecting test substance
Patent number
10,725,048
Issue date
Jul 28, 2020
Sysmex Corporation
Kenji Akama
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting test substance
Patent number
10,267,759
Issue date
Apr 23, 2019
Sysmex Corporation
Nobuyasu Hori
G01 - MEASURING TESTING
Information
Patent Grant
Method for amplifying nucleic acid
Patent number
10,066,261
Issue date
Sep 4, 2018
Sysmex Corporation
Seigo Suzuki
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Analyte detection method, fluorescence detection method, and fluore...
Patent number
9,885,661
Issue date
Feb 6, 2018
Sysmex Corporation
Ayato Tagawa
G01 - MEASURING TESTING
Information
Patent Grant
Method of electrochemically detecting target substance, method of e...
Patent number
9,157,885
Issue date
Oct 13, 2015
Sysmex Corporation
Shigeki Iwanaga
G01 - MEASURING TESTING
Information
Patent Grant
Method for electrochemically detecting target substance, method for...
Patent number
9,157,884
Issue date
Oct 13, 2015
Sysmex Corporation
Masayoshi Seike
G01 - MEASURING TESTING
Information
Patent Grant
Detection device for detecting a test substance
Patent number
9,057,688
Issue date
Jun 16, 2015
Sysmex Corporation
Nobuyasu Hori
G01 - MEASURING TESTING
Information
Patent Grant
Method of electrochemically detecting a sample substance
Patent number
8,920,626
Issue date
Dec 30, 2014
Sysmex Corporation
Seigo Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating thin-film transistor
Patent number
7,901,978
Issue date
Mar 8, 2011
National University Corporation NARA Institute of Science and Technology
Yukiharu Uraoka
C30 - CRYSTAL GROWTH
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR DETECTING TEST SUBSTANCE
Publication number
20190025319
Publication date
Jan 24, 2019
SYSMEX CORPORATION
Kenji AKAMA
G01 - MEASURING TESTING
Information
Patent Application
METAL ION DETECTION METHOD, TEST SUBSTANCE DETECTION METHOD
Publication number
20180011054
Publication date
Jan 11, 2018
SYSMEX CORPORATION
Nobuyasu HORI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR AMPLIFYING NUCLEIC ACID
Publication number
20160122809
Publication date
May 5, 2016
National University Corporation Nagoya University
Seigo SUZUKI
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD OF DETECTING TEST SUBSTANCE
Publication number
20160116428
Publication date
Apr 28, 2016
SYSMEX CORPORATION
Nobuyasu HORI
G01 - MEASURING TESTING
Information
Patent Application
ANALYTE DETECTION METHOD, FLUORESCENCE DETECTION METHOD, AND FLUORE...
Publication number
20150104880
Publication date
Apr 16, 2015
SYSMEX CORPORATION
Ayato TAGAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING DISSOCIATION OF DOUBLE STRANDED NUCLEIC ACID...
Publication number
20150093836
Publication date
Apr 2, 2015
National University Corporation Nagoya University
Seigo SUZUKI
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD AND KIT FOR ELECTROCHEMICALLY DETECTING ANALYTE
Publication number
20140291166
Publication date
Oct 2, 2014
SYSMEX CORPORATION
Fumiya FUTAMATSU
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD FOR ELECTROCHEMICALLY DETECTING ANALYTE
Publication number
20120267258
Publication date
Oct 25, 2012
Nara Institute of Science and Technology
Yukiharu URAOKA
G01 - MEASURING TESTING
Information
Patent Application
PHOTOCURRENT DETECTION ELECTRODE, MANUFACTURING METHOD, AND WORKING...
Publication number
20120161268
Publication date
Jun 28, 2012
SYSMEX CORPORATION
Shigeki IWANAGA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ELECTROCHEMICALLY DETECTING A SAMPLE SUBSTANCE
Publication number
20120132543
Publication date
May 31, 2012
SYSMEX CORPORATION
Seigo SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE FOR DETECTING A TEST SUBSTANCE, ELECTRODE SUBSTRAT...
Publication number
20120103836
Publication date
May 3, 2012
SYSMEX CORPORATION
Nobuyasu HORI
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ELECTROCHEMICALLY DETECTING TARGET SUBSTANCE, METHOD OF E...
Publication number
20120080324
Publication date
Apr 5, 2012
SYSMEX CORPORATION
Shigeki IWANAGA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ELECTROCHEMICALLY DETECTING TARGET SUBSTANCE, METHOD FOR...
Publication number
20120048747
Publication date
Mar 1, 2012
SYSMEX CORPORATION
Masayoshi SEIKE
G01 - MEASURING TESTING
Information
Patent Application
Test chip, detection apparatus, and method for detecting analyte
Publication number
20100112578
Publication date
May 6, 2010
Sysmex Corporation
Shigeki Iwanaga
G01 - MEASURING TESTING
Information
Patent Application
Method for detecting analyte, detection apparatus, and test chip
Publication number
20100108539
Publication date
May 6, 2010
Sysmex Corporation
Shigeki Iwanaga
G01 - MEASURING TESTING
Information
Patent Application
Method of Fabricating Thin-Film Transistor
Publication number
20090050880
Publication date
Feb 26, 2009
National University Corporation Nara Institute of Science and Technology
Yukiharu Uraoka
C30 - CRYSTAL GROWTH