Hiroya Shimizu

Person

Ryugasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fine pitch grid array type semiconductor device
- Patent number 8,362,614
- Issue date Jan 29, 2013
- Elpida Memory, Inc.
- Mitsuaki Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductance analysis system and method and program therefor
- Patent number 7,823,096
- Issue date Oct 26, 2010
- Elpida Memory, Inc.
- Mitsuaki Katagiri
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for designing device, system for aiding to design device, an...
- Patent number 7,681,154
- Issue date Mar 16, 2010
- Elpida Memory, Inc.
- Mitsuaki Katagiri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, noise reduction method, and shield cover
- Patent number 7,345,892
- Issue date Mar 18, 2008
- NEC Corporation
- Masaharu Imazato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 7,119,446
- Issue date Oct 10, 2006
- Hitachi, Ltd.
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,030,478
- Issue date Apr 18, 2006
- Renesas Technology Corp.
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe structure
- Patent number 6,977,514
- Issue date Dec 20, 2005
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 6,955,870
- Issue date Oct 18, 2005
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for carrying out inspection of a semiconductor de...
- Patent number 6,952,110
- Issue date Oct 4, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test device for same
- Patent number 6,885,208
- Issue date Apr 26, 2005
- Renesas Technology Corp.
- Toshio Miyatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 6,882,039
- Issue date Apr 19, 2005
- Renesas Technology Corp.
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Packaging device for holding a plurality of semiconductor devices t...
- Patent number 6,864,568
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device man...
- Patent number 6,864,695
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and method for manufacturing...
- Patent number 6,828,810
- Issue date Dec 7, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,784,533
- Issue date Aug 31, 2004
- Renesas Technology Corp.
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe structure
- Patent number 6,614,246
- Issue date Sep 2, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,531,785
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing semiconductor device and apparatus usable therein
- Patent number 6,465,264
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,326,699
- Issue date Dec 4, 2001
- Hitachi, Ltd.
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 6,211,576
- Issue date Apr 3, 2001
- Hitachi, Ltd.
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory module and an IC card
- Patent number 5,838,549
- Issue date Nov 17, 1998
- Hitachi, Ltd.
- Tatsuya Nagata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DESIGNING DEVICE, SYSTEM FOR AIDING TO DESIGN DEVICE, AN...
- Publication number 20080072194
- Publication date Mar 20, 2008
- Elpida Memory, Inc.
- Mitsuaki KATAGIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inductance analysis system and method and program therefor
- Publication number 20070033553
- Publication date Feb 8, 2007
- ELPIDA MEMORY, INC.
- Mitsuaki Katagiri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device
- Publication number 20060125078
- Publication date Jun 15, 2006
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fine pitch grid array type semiconductor device
- Publication number 20060081972
- Publication date Apr 20, 2006
- ELPIDA MEMORY, INC.
- Mitsuaki Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device, noise reduction method, and shield cover
- Publication number 20050270758
- Publication date Dec 8, 2005
- NEC Corporation
- Masaharu Imazato
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device
- Publication number 20050184391
- Publication date Aug 25, 2005
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Testing apparatus for carrying out inspection of a semiconductor de...
- Publication number 20050032252
- Publication date Feb 10, 2005
- Renesas Technology Corporation
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20050006751
- Publication date Jan 13, 2005
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe structure
- Publication number 20040145382
- Publication date Jul 29, 2004
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and method for manufacturing...
- Publication number 20030122550
- Publication date Jul 3, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing a semicondutor device
- Publication number 20030104641
- Publication date Jun 5, 2003
- Hitachi, Ltd
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and test device for same
- Publication number 20030047731
- Publication date Mar 13, 2003
- Toshio Miyatake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Packaging device for holding a plurality of semiconductor devices t...
- Publication number 20030015779
- Publication date Jan 23, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20020190336
- Publication date Dec 19, 2002
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20020047179
- Publication date Apr 25, 2002
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device testing apparatus and semiconductor device man...
- Publication number 20020033707
- Publication date Mar 21, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20010000116
- Publication date Apr 5, 2001
- Hiroya Shimizu
- H01 - BASIC ELECTRIC ELEMENTS

Hiroya Shimizu

Person

Patents Grantslast 30 patents

Fine pitch grid array type semiconductor device

Inductance analysis system and method and program therefor

Method for designing device, system for aiding to design device, an...

Semiconductor device, noise reduction method, and shield cover

Semiconductor device

Semiconductor device

Probe structure

Method of manufacturing a semiconductor device

Testing apparatus for carrying out inspection of a semiconductor de...

Semiconductor device and test device for same

Semiconductor device

Packaging device for holding a plurality of semiconductor devices t...

Semiconductor device testing apparatus and semiconductor device man...

Semiconductor device testing apparatus and method for manufacturing...

Semiconductor device

Probe structure

Semiconductor device

Method for producing semiconductor device and apparatus usable therein

Semiconductor device

Semiconductor device

Memory module and an IC card

Patents Applicationslast 30 patents

METHOD FOR DESIGNING DEVICE, SYSTEM FOR AIDING TO DESIGN DEVICE, AN...

Inductance analysis system and method and program therefor

Semiconductor device

Fine pitch grid array type semiconductor device

Semiconductor device, noise reduction method, and shield cover

Semiconductor device

Testing apparatus for carrying out inspection of a semiconductor de...

Semiconductor device

Probe structure

Semiconductor device testing apparatus and method for manufacturing...

Method of manufacturing a semicondutor device

Semiconductor device and test device for same

Packaging device for holding a plurality of semiconductor devices t...

Semiconductor device

Semiconductor device

Semiconductor device testing apparatus and semiconductor device man...

Semiconductor device