TREA

Hiroya UMEKI

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,639,943
    • Issue date May 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,486,890
    • Issue date Nov 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,320,443
    • Issue date May 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiroya Umeki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20250116681
    • Publication date Apr 10, 2025
    • Hitachi High-Tech Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20250110142
    • Publication date Apr 3, 2025
    • Hitachi High-Tech Corporation
    • Tatsuki TAKAKURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND CONTROL METHOD OF AUTOMATIC ANALYZER
    • Publication number 20240118298
    • Publication date Apr 11, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Hitomi NISHIMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer and Method of Storing Reagent in Automatic Analyzer
    • Publication number 20240042448
    • Publication date Feb 8, 2024
    • Hitachi High-Tech Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND CONTROL PROGRAM FOR AUTOMATIC ANALYZER
    • Publication number 20230010798
    • Publication date Jan 12, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuichiro OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20210215728
    • Publication date Jul 15, 2021
    • Hitachi High-Tech Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200278367
    • Publication date Sep 3, 2020
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200249249
    • Publication date Aug 6, 2020
    • Hitachi High-Technologies Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200241029
    • Publication date Jul 30, 2020
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING