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Hiroya UMEKI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,639,943
    • Issue date May 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,486,890
    • Issue date Nov 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,320,443
    • Issue date May 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiroya Umeki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents