HIROYASU ANDO

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TOKYO, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe and contact inspection device
- Patent number 10,024,908
- Issue date Jul 17, 2018
- Kabushiki Kaisha Nihon Micronics
- Hiroyasu Ando
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 9,583,857
- Issue date Feb 28, 2017
- KABUSHIKI KAISHA MIHON MICRONICS
- Mika Nasu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE AND CONTACT INSPECTION DEVICE
- Publication number 20160146885
- Publication date May 26, 2016
- Kabushiki Kaisha Nihon Micronics
- Hiroyasu ANDO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONTACTOR AND ELECTRICAL CONNECTING APPARATUS
- Publication number 20160118738
- Publication date Apr 28, 2016
- Kabushiki Kaisha Nihon Micronics
- MIKA NASU
- H01 - BASIC ELECTRIC ELEMENTS