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Hiroyasu Kaga

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Patents Grantslast 30 patents

  • Information Patent Grant

    Gas field ion source and method for using same, ion beam device, an...
    • Patent number 8,847,173
    • Issue date Sep 30, 2014
    • Hitachi High-Technologies Corporation
    • Yoshimi Kawanami
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 8,581,484
    • Issue date Nov 12, 2013
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus using an electrostatic lens gun
    • Patent number 8,399,863
    • Issue date Mar 19, 2013
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Focused ion beam apparatus
    • Patent number 7,956,336
    • Issue date Jun 7, 2011
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,804,073
    • Issue date Sep 28, 2010
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam processing apparatus
    • Patent number 7,705,329
    • Issue date Apr 27, 2010
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Focused ION beam apparatus
    • Patent number 7,667,209
    • Issue date Feb 23, 2010
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged beam gun
    • Patent number 7,601,971
    • Issue date Oct 13, 2009
    • Hitachi High-Technologies Corporation
    • Takeshi Tanaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer alignment method for dual beam system
    • Patent number 7,573,049
    • Issue date Aug 11, 2009
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Focused ion beam apparatus and liquid metal ion source
    • Patent number 7,435,972
    • Issue date Oct 14, 2008
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,420,181
    • Issue date Sep 2, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wafer alignment method for dual beam system
    • Patent number 7,323,697
    • Issue date Jan 29, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,211,805
    • Issue date May 1, 2007
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Focused ion beam apparatus and aperture
    • Patent number 7,189,982
    • Issue date Mar 13, 2007
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,005,651
    • Issue date Feb 28, 2006
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    High-voltage electric apparatus
    • Patent number 6,815,608
    • Issue date Nov 9, 2004
    • Hitachi, Ltd.
    • Takanori Sato
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Thermal field emission electron gun
    • Patent number 5,059,792
    • Issue date Oct 22, 1991
    • Hitachi, Ltd.
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Apparatus for introducing oxygen gas
    • Patent number 4,772,821
    • Issue date Sep 20, 1988
    • Hitachi, Ltd.
    • Shigeyuki Hosoki
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

  • Information Patent Application

    GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...
    • Publication number 20130119252
    • Publication date May 16, 2013
    • Yoshimi Kawanami
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    LIQUID METAL ION GUN
    • Publication number 20120126684
    • Publication date May 24, 2012
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    FOCUSED ION BEAM APPARATUS
    • Publication number 20090256081
    • Publication date Oct 15, 2009
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Processing Apparatus
    • Publication number 20080290291
    • Publication date Nov 27, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu KAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20080210883
    • Publication date Sep 4, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Wafer alignment method for dual beam system
    • Publication number 20080174779
    • Publication date Jul 24, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • G01 - MEASURING TESTING
  • Information Patent Application

    Charged Beam Gun
    • Publication number 20080135756
    • Publication date Jun 12, 2008
    • Hitachi High-Technologies Corporation
    • Takeshi Tanaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    Focused ION beam apparatus
    • Publication number 20080067445
    • Publication date Mar 20, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20070257200
    • Publication date Nov 8, 2007
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Focused ion beam apparatus and aperture
    • Publication number 20070152174
    • Publication date Jul 5, 2007
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20060097186
    • Publication date May 11, 2006
    • Hitachi High-Technologies
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Wafer alignment method for dual beam system
    • Publication number 20060091321
    • Publication date May 4, 2006
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • G01 - MEASURING TESTING
  • Information Patent Application

    Focused ion beam apparatus and aperture
    • Publication number 20060054840
    • Publication date Mar 16, 2006
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20050127304
    • Publication date Jun 16, 2005
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    High-voltage electric apparatus
    • Publication number 20040094327
    • Publication date May 20, 2004
    • Takanori Sato
    • H01 - BASIC ELECTRIC ELEMENTS