Hiroyasu Koike

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Open-loop for waveform acquisition
- Patent number 6,853,941
- Issue date Feb 8, 2005
- NPTest, Inc.
- Hui Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BATTERY DEVICE, CONTROL METHOD, AND CONTROL PROGRAM
- Publication number 20240313270
- Publication date Sep 19, 2024
- RENESAS ELECTRONICS CORPORATION
- Masaki HOGARI
- G01 - MEASURING TESTING
Information Patent Application
Open-loop for waveform acquisition
- Publication number 20030016153
- Publication date Jan 23, 2003
- Hui Wang
- G01 - MEASURING TESTING