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Hiroyasu Nakayama

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20120133380
    • Publication date May 31, 2012
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND DEBUG METHOD
    • Publication number 20120136603
    • Publication date May 31, 2012
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20110288810
    • Publication date Nov 24, 2011
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20110137606
    • Publication date Jun 9, 2011
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142393
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142383
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • MASARU GOISHI
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142391
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • Shinichi Ishikawa
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    TEST APPARATUS AND TEST METHOD
    • Publication number 20100142392
    • Publication date Jun 10, 2010
    • Advantest Corporation
    • Shinichi ISHIKAWA
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    Pattern generator and testing apparatus
    • Publication number 20060195722
    • Publication date Aug 31, 2006
    • Advantest Corporation
    • Hiroyasu Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Pattern generator and test apparatus
    • Publication number 20060161372
    • Publication date Jul 20, 2006
    • Advantest Corporation
    • Hiroyasu Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Test apparatus and testing method
    • Publication number 20060052964
    • Publication date Mar 9, 2006
    • Advantest Corporation
    • Tomoyuki Sugaya
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor tester
    • Publication number 20050022088
    • Publication date Jan 27, 2005
    • Hiroyasu Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor device testing apparatus and method for testing semic...
    • Publication number 20010041967
    • Publication date Nov 15, 2001
    • Advantest Corporation
    • Hiroyasu Nakayama
    • G01 - MEASURING TESTING