Hiroyasu Shichi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion milling apparatus
- Patent number 11,257,654
- Issue date Feb 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Kengo Asai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device, ion source, and ion milling method
- Patent number 11,158,481
- Issue date Oct 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Kengo Asai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field ionization source, ion beam apparatus, and beam irradiation m...
- Patent number 10,971,329
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and cleaning method for gas field ion source
- Patent number 10,840,070
- Issue date Nov 17, 2020
- HITACHI HIGH-TECH CORPORATION
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-electro-mechanical-systems processing method, and micro-elect...
- Patent number 10,662,059
- Issue date May 26, 2020
- Hitachi, Ltd.
- Keiji Watanabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Ion beam apparatus
- Patent number 10,651,006
- Issue date May 12, 2020
- Hitachi High-Tech Science Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 10,636,623
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microstructure manufacturing method and ION beam apparatus
- Patent number 10,549,989
- Issue date Feb 4, 2020
- Hitachi, Ltd.
- Hiroyasu Shichi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Microstructure manufacturing method and microstructure manufacturin...
- Patent number 10,546,721
- Issue date Jan 28, 2020
- Hitachi, Ltd.
- Keiji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 10,366,858
- Issue date Jul 30, 2019
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling system
- Patent number 10,361,065
- Issue date Jul 23, 2019
- Hitachi High-Technologies Corporation
- Kengo Asai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and sample observation method
- Patent number 10,340,117
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device and ion milling method
- Patent number 10,332,722
- Issue date Jun 25, 2019
- Hitachi High-Technologies Corporation
- Kengo Asai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror ion microscope and ion beam control method
- Patent number 10,304,657
- Issue date May 28, 2019
- Hitachi, Ltd.
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device, ion source and ion milling method
- Patent number 10,304,653
- Issue date May 28, 2019
- Hitachi High-Technologies Corporation
- Kengo Asai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control method and control program for focused ion beam device
- Patent number 10,276,341
- Issue date Apr 30, 2019
- Hitachi, Ltd.
- Keiji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam apparatus and ion beam irradiation method
- Patent number 10,211,022
- Issue date Feb 19, 2019
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam system
- Patent number 10,163,602
- Issue date Dec 25, 2018
- Hitachi High-Tech Science Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and emitter tip adjustment method
- Patent number 9,761,407
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source and ion beam device using same
- Patent number 9,640,360
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 9,508,521
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope
- Patent number 9,111,716
- Issue date Aug 18, 2015
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source and method for using same, ion beam device, an...
- Patent number 8,847,173
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,796,651
- Issue date Aug 5, 2014
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,779,400
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion beam device
- Patent number 8,779,380
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 8,618,520
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Ion beam device
- Patent number 8,563,944
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source, charged particle microscope, and apparatus
- Patent number 8,530,865
- Issue date Sep 10, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,481,980
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230335367
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi OHSHIMA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Electron Microscope
- Publication number 20230238212
- Publication date Jul 27, 2023
- Hitachi High-Tech Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING APPARATUS
- Publication number 20210287871
- Publication date Sep 16, 2021
- Hitachi High-Technologies Corporation
- Kengo ASAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE AND CLEANING METHOD FOR GAS FIELD ION SOURCE
- Publication number 20200294776
- Publication date Sep 17, 2020
- Hitachi High-Technologies Corporation
- Yoshimi KAWANAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device
- Publication number 20190295802
- Publication date Sep 26, 2019
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING DEVICE, lON SOURCE, AND ION MILLING METHOD
- Publication number 20190237291
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Kengo ASAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-ELECTRO-MECHANICAL-SYSTEMS PROCESSING METHOD, AND MICRO-ELECT...
- Publication number 20190062157
- Publication date Feb 28, 2019
- Hitachi, Ltd
- Keiji WATANABE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
FIELD IONIZATION SOURCE, ION BEAM APPARATUS, AND BEAM IRRADIATION M...
- Publication number 20190051491
- Publication date Feb 14, 2019
- Hitachi High-Technologies Corporation
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Apparatus
- Publication number 20180308658
- Publication date Oct 25, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING SYSTEM
- Publication number 20180286633
- Publication date Oct 4, 2018
- Hitachi High-Technologies Corporation
- Kengo ASAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control Method and Control Program for Focused Ion Beam Device
- Publication number 20180261423
- Publication date Sep 13, 2018
- Hitachi, Ltd
- Keiji WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microstructure Manufacturing Method and Microstructure Manufacturin...
- Publication number 20180261427
- Publication date Sep 13, 2018
- Hitachi, Ltd
- Keiji WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microstructure manufacturing method and ION beam apparatus
- Publication number 20180244517
- Publication date Aug 30, 2018
- Hitachi, Ltd
- Hiroyasu Shichi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Mirror Ion Microscope and Ion Beam Control Method
- Publication number 20180025888
- Publication date Jan 25, 2018
- Hitachi, Ltd
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM SYSTEM
- Publication number 20180012726
- Publication date Jan 11, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device
- Publication number 20170352517
- Publication date Dec 7, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20170229284
- Publication date Aug 10, 2017
- Hitachi, Ltd
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM APPARATUS AND ION BEAM IRRADIATION METHOD
- Publication number 20170229277
- Publication date Aug 10, 2017
- Hitachi High-Technologies Corporation
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING DEVICE, ION SOURCE AND ION MILLING METHOD
- Publication number 20170221671
- Publication date Aug 3, 2017
- Hitachi High-Technologies Corporation
- Kengo ASAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING DEVICE AND ION MILLING METHOD
- Publication number 20170221677
- Publication date Aug 3, 2017
- Hitachi High-Technologies Corporation
- Kengo ASAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20170076902
- Publication date Mar 16, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device and Emitter Tip Adjustment Method
- Publication number 20160225575
- Publication date Aug 4, 2016
- Hiroyuki MUTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE
- Publication number 20150083930
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20140319370
- Publication date Oct 30, 2014
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE AND ION BEAM DEVICE USING SAME
- Publication number 20140299768
- Publication date Oct 9, 2014
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20130320209
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...
- Publication number 20130284593
- Publication date Oct 31, 2013
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Charged Particle Microscope and Ion Microscope
- Publication number 20130126731
- Publication date May 23, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...
- Publication number 20130119252
- Publication date May 16, 2013
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...
- Publication number 20130087704
- Publication date Apr 11, 2013
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY

Hiroyasu Shichi

Person

Patents Grantslast 30 patents

Ion milling apparatus

Ion milling device, ion source, and ion milling method

Field ionization source, ion beam apparatus, and beam irradiation m...

Ion beam device and cleaning method for gas field ion source

Micro-electro-mechanical-systems processing method, and micro-elect...

Ion beam apparatus

Ion beam device

Microstructure manufacturing method and ION beam apparatus

Microstructure manufacturing method and microstructure manufacturin...

Ion beam device

Ion milling system

Ion beam device and sample observation method

Ion milling device and ion milling method

Mirror ion microscope and ion beam control method

Ion milling device, ion source and ion milling method

Control method and control program for focused ion beam device

Ion beam apparatus and ion beam irradiation method

Ion beam system

Ion beam device and emitter tip adjustment method

Ion source and ion beam device using same

Ion beam device

Charged particle microscope

Gas field ion source and method for using same, ion beam device, an...

Method and apparatus for specimen fabrication

Ion source, ion beam processing/observation apparatus, charged part...

Ion beam device

Method and apparatus for processing a micro sample

Ion beam device

Gas field ion source, charged particle microscope, and apparatus

Ion source, ion beam processing/observation apparatus, charged part...

Patents Applicationslast 30 patents

ELECTRON BEAM APPLICATION DEVICE

Electron Microscope

ION MILLING APPARATUS

ION BEAM DEVICE AND CLEANING METHOD FOR GAS FIELD ION SOURCE

Ion Beam Device

ION MILLING DEVICE, lON SOURCE, AND ION MILLING METHOD

MICRO-ELECTRO-MECHANICAL-SYSTEMS PROCESSING METHOD, AND MICRO-ELECT...

FIELD IONIZATION SOURCE, ION BEAM APPARATUS, AND BEAM IRRADIATION M...

Ion Beam Apparatus

ION MILLING SYSTEM

Control Method and Control Program for Focused Ion Beam Device

Microstructure Manufacturing Method and Microstructure Manufacturin...

Microstructure manufacturing method and ION beam apparatus

Mirror Ion Microscope and Ion Beam Control Method

ION BEAM SYSTEM

Ion Beam Device

ION BEAM DEVICE AND SAMPLE OBSERVATION METHOD

ION BEAM APPARATUS AND ION BEAM IRRADIATION METHOD

ION MILLING DEVICE, ION SOURCE AND ION MILLING METHOD

ION MILLING DEVICE AND ION MILLING METHOD

ION BEAM DEVICE

Ion Beam Device and Emitter Tip Adjustment Method

CHARGED PARTICLE MICROSCOPE

ION BEAM DEVICE

ION SOURCE AND ION BEAM DEVICE USING SAME

ION BEAM PROCESSING APPARATUS

ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...

Charged Particle Microscope and Ion Microscope

GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...

GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...