HIROYASU SIMIZU

Person

KAWASAKI, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for reducing blur and variation in blur in projected images...
- Patent number 6,906,336
- Issue date Jun 14, 2005
- Nikon Corporation
- Hiroyasu Simizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam projection-lens system exhibiting reduced blu...
- Patent number 6,635,881
- Issue date Oct 21, 2003
- Nikon Corporation
- Atsushi Yamada
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Magnetic lenses, charged-particle-beam optical systems, and charged...
- Patent number 6,627,899
- Issue date Sep 30, 2003
- Nikon Corporation
- Hiroyasu Simizu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron-beam sources exhibiting reduced spherical aberration, and...
- Patent number 6,621,090
- Issue date Sep 16, 2003
- Nikon Corporation
- Hiroyasu Simizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for achieving alignment of a beam-propagation a...
- Patent number 6,608,313
- Issue date Aug 19, 2003
- Nikon Corporation
- Hiroyasu Simizu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and methods for reducing Coulombic blur in charged-partic...
- Patent number 6,545,282
- Issue date Apr 8, 2003
- Nikon Corporation
- Hiroyasu Simizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam projection method and apparatus
- Patent number 6,087,668
- Issue date Jul 11, 2000
- Nikon Corporation
- Hiroyasu Simizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle-beam optical system exhibiting aberration correction
- Patent number 6,066,855
- Issue date May 23, 2000
- Nikon Corporation
- Hiroyasu Simizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle-beam optical system
- Patent number 6,049,084
- Issue date Apr 11, 2000
- Nikon Corporation
- Hiroyasu Simizu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam apparatus and method of using the same
- Patent number 6,008,498
- Issue date Dec 28, 1999
- Nikon Corporation
- Hiroyasu Simizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam transfer device exhibiting low aberration
- Patent number 5,747,819
- Issue date May 5, 1998
- Nikon Corporation
- Mamoru Nakasuji
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Methods for reducing blur and variation in blur in projected images...
- Publication number 20030059716
- Publication date Mar 27, 2003
- NIKON CORPORATION
- Hiroyasu Simizu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus and methods for reducing coulombic blur in charged-partic...
- Publication number 20020153494
- Publication date Oct 24, 2002
- NIKON CORPORATION
- Hiroyasu Simizu
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC LENSES, CHARGED-PARTICLE-BEAM OPTICAL SYSTEMS, AND CHARGED...
- Publication number 20020096644
- Publication date Jul 25, 2002
- HIROYASU SIMIZU
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Electron-beam sources exhibiting reduced spherical aberration, and...
- Publication number 20020008209
- Publication date Jan 24, 2002
- NIKON CORPORATION
- Hiroyasu Simizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-particle-beam projection-lens system exhibiting reduced blu...
- Publication number 20010038080
- Publication date Nov 8, 2001
- NIKON CORPORATION
- Atsushi Yamada
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Methods and devices for achieving alignment of a beam-propagation a...
- Publication number 20010010362
- Publication date Aug 2, 2001
- NIKON CORPORATION
- Hiroyasu Simizu
- B82 - NANO-TECHNOLOGY

HIROYASU SIMIZU

Person

Patents Grantslast 30 patents

Methods for reducing blur and variation in blur in projected images...

Charged-particle-beam projection-lens system exhibiting reduced blu...

Magnetic lenses, charged-particle-beam optical systems, and charged...

Electron-beam sources exhibiting reduced spherical aberration, and...

Methods and devices for achieving alignment of a beam-propagation a...

Apparatus and methods for reducing Coulombic blur in charged-partic...

Charged-particle-beam projection method and apparatus

Charged-particle-beam optical system exhibiting aberration correction

Charged-particle-beam optical system

Charged particle beam apparatus and method of using the same

Charged particle beam transfer device exhibiting low aberration

Patents Applicationslast 30 patents

Methods for reducing blur and variation in blur in projected images...

Apparatus and methods for reducing coulombic blur in charged-partic...

MAGNETIC LENSES, CHARGED-PARTICLE-BEAM OPTICAL SYSTEMS, AND CHARGED...

Electron-beam sources exhibiting reduced spherical aberration, and...

Charged-particle-beam projection-lens system exhibiting reduced blu...

Methods and devices for achieving alignment of a beam-propagation a...