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Hiroyoshi Nishio
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Himeji, JP
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last 30 patents
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Patent Grant
Centralized monitoring system, analyzing system and centralized mon...
Patent number
9,063,101
Issue date
Jun 23, 2015
Sysmex Corporation
Hiroyuki Tanaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CENTRALIZED MONITORING SYSTEM, ANALYZING SYSTEM AND CENTRALIZED MON...
Publication number
20110223077
Publication date
Sep 15, 2011
SYSMEX CORPORATION
Hiroyuki Tanaka
G01 - MEASURING TESTING
Information
Patent Application
Centralized monitoring system, analyzing system and centralized mon...
Publication number
20070212261
Publication date
Sep 13, 2007
SYSMEX CORPORATION
Hiroyuki Tanaka
G01 - MEASURING TESTING