Hiroyoshi Tsuboi

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 6,971,052
- Issue date Nov 29, 2005
- Fujitsu Limited
- Hiroyoshi Tsuboi
- G11 - INFORMATION STORAGE
Information Patent Grant
Level shifter
- Patent number 6,774,673
- Issue date Aug 10, 2004
- Fujitsu Limited
- Hiroyoshi Tsuboi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and semiconductor device testing method
- Patent number 6,643,809
- Issue date Nov 4, 2003
- Fujitsu Limited
- Hiroyoshi Tsuboi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a second voltage supplier supply...
- Patent number 6,487,137
- Issue date Nov 26, 2002
- Fujitsu Limited
- Hiroyoshi Tsuboi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit and method for testing the same
- Publication number 20030102885
- Publication date Jun 5, 2003
- FUJITSU LIMITED
- Hiroyoshi Tsuboi
- G01 - MEASURING TESTING
Information Patent Application
Level shifter
- Publication number 20030098711
- Publication date May 29, 2003
- FUJITSU LIMITED
- Hiroyoshi Tsuboi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor memory device having a second voltage supplier supply...
- Publication number 20020024868
- Publication date Feb 28, 2002
- FUJITSU LIMITED
- Hiroyoshi Tsuboi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and semiconductor device testing method
- Publication number 20010017552
- Publication date Aug 30, 2001
- FUJITSU LIMITED
- Hiroyoshi Tsuboi
- G01 - MEASURING TESTING