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Scanning probe microscope
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Patent number 9,678,104
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Issue date Jun 13, 2017
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Hitachi High-Tech Science Corporation
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Hiroyoshi Yamamoto
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G01 - MEASURING TESTING
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Scanning probe microscope
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Patent number 6,435,015
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Issue date Aug 20, 2002
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Seiko Instruments Inc.
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Hiroyoshi Yamamoto
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B82 - NANO-TECHNOLOGY
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Atomic force microscope
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Patent number 5,406,833
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Issue date Apr 18, 1995
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Seiko Instruments, Inc.
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Hiroyoshi Yamamoto
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B82 - NANO-TECHNOLOGY
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