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Hiroyuki Abe
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Sendai-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Noncontact measuring system for electrical conductivity
Patent number
6,879,167
Issue date
Apr 12, 2005
Tohoku Techno Arch Co., Ltd.
Yang Ju
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Noncontact measuring system for electrical conductivity
Publication number
20040100280
Publication date
May 27, 2004
TOHOKU TECHNO ARCH CO., LTD.
Yang Ju
G01 - MEASURING TESTING