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Hiroyuki Ebi
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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Flow rate sensor
Patent number
9,026,383
Issue date
May 5, 2015
Horiba Stec, Co., Ltd.
Hiroshi Takakura
G01 - MEASURING TESTING
Information
Patent Grant
Thermal type mass flow meter, and thermal type mass flow control de...
Patent number
8,219,329
Issue date
Jul 10, 2012
Horiba Stec, Co., Ltd.
Hiroyuki Ebi
G05 - CONTROLLING REGULATING
Information
Patent Grant
Semiconductor fabrication system, and flow rate correction method a...
Patent number
7,682,843
Issue date
Mar 23, 2010
Tokyo Electron Limited
Shuji Moriya
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
CCD sensor incorporating parallel diffusion regions within the output
Patent number
7,015,963
Issue date
Mar 21, 2006
Horiba, Ltd.
Hiroyuki Ebi
G01 - MEASURING TESTING
Information
Patent Grant
Communication device and auxiliary device for communication
Patent number
6,633,231
Issue date
Oct 14, 2003
Horiba, Ltd.
Kazutaka Okamoto
G08 - SIGNALLING
Information
Patent Grant
Infrared radiation gas analyzer
Patent number
4,501,968
Issue date
Feb 26, 1985
Horiba, Ltd.
Hiroyuki Ebi
G01 - MEASURING TESTING
Information
Patent Grant
Infrared radiation gas analyzer
Patent number
4,499,378
Issue date
Feb 12, 1985
Horiba, Ltd.
Kimio Miyatake
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FLOW RATE SENSOR
Publication number
20120191381
Publication date
Jul 26, 2012
HORIBA STEC, CO., LTD.
Hiroshi Takakura
G01 - MEASURING TESTING
Information
Patent Application
THERMAL TYPE MASS FLOW METER, AND THERMAL TYPE MASS FLOW CONTROL DE...
Publication number
20110125445
Publication date
May 26, 2011
Hiroyuki Ebi
G05 - CONTROLLING REGULATING
Information
Patent Application
SEMICONDUCTOR FABRICATION SYSTEM, AND FLOW RATE CORRECTION METHOD A...
Publication number
20090061541
Publication date
Mar 5, 2009
TOKYO ELECTRON LIMITED
Shuji Moriya
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
CCD sensor
Publication number
20030001583
Publication date
Jan 2, 2003
HORIBA, LTD.
Hiroyuki Ebi
G01 - MEASURING TESTING