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Imabari, JP
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Patents Grants
last 30 patents
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Patent Grant
Analysis device and analysis disc used for the same
Patent number
7,253,886
Issue date
Aug 7, 2007
Matsushita Electric Industrial Co., Ltd.
Tsugio Wakita
G01 - MEASURING TESTING
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Patent Grant
Liquid specimen analysis disk assembly
Patent number
7,218,394
Issue date
May 15, 2007
Matsushita Electric Industrial Co., Ltd.
Kenji Murakami
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Analysis device and analysis disc used for the same
Publication number
20060039002
Publication date
Feb 23, 2006
Matsushita Electric Industrial Co., Ltd.
Tsugio Wakita
G01 - MEASURING TESTING
Information
Patent Application
Liquid specimen analysis disk assembly
Publication number
20060023208
Publication date
Feb 2, 2006
Matsushita Elec. Ind. Co. Ltd.
Kenji Murakami
G01 - MEASURING TESTING