Hiroyuki Hoshi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Circuit property measurement method
- Patent number 7,173,433
- Issue date Feb 6, 2007
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Hoshi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,768,153
- Issue date Jul 27, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Hoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor with comb electrodes and via holes
- Patent number 6,252,266
- Issue date Jun 26, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Hoshi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION PATTERN AND CALIBRATION JIG
- Publication number 20070103144
- Publication date May 10, 2007
- Mitsubishi Electric Corporation
- Hiroyuki HOSHI
- G01 - MEASURING TESTING
Information Patent Application
Property measurement method for high frequency circuit, calibration...
- Publication number 20050258819
- Publication date Nov 24, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Hoshi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20040012044
- Publication date Jan 22, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Hoshi
- H03 - BASIC ELECTRONIC CIRCUITRY