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Hiroyuki Iwaki
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Nirasaki-Shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
System and method to calibrate a plurality of wafer inspection syst...
Patent number
11,703,459
Issue date
Jul 18, 2023
Tokyo Electron Limited
Michael Carcasi
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for spin process video analysis during substrat...
Patent number
11,637,031
Issue date
Apr 25, 2023
Tokyo Electron Limited
Michael Carcasi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Baking device and baking method of baking a chemically amplified re...
Patent number
7,402,782
Issue date
Jul 22, 2008
Tokyo Electron Limited
Hiroyuki Iwaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Substrate processing apparatus and substrate processing method
Patent number
7,401,988
Issue date
Jul 22, 2008
Tokyo Electron Limited
Takayuki Katano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate processing apparatus and substrate processing method
Patent number
7,208,066
Issue date
Apr 24, 2007
Tokyo Electron Limited
Junichi Kitano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate processing method and substrate processing apparatus
Patent number
6,485,203
Issue date
Nov 26, 2002
Tokyo Electron Limited
Takayuki Katano
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Patents Applications
last 30 patents
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
Publication number
20240248417
Publication date
Jul 25, 2024
TOKYO ELECTRON LIMITED
Yoji SAKATA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Systems and Methods for Spin Process Video Analysis During Substrat...
Publication number
20210129166
Publication date
May 6, 2021
TOKYO ELECTRON LIMITED
Michael Carcasi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and Methods for Spin Process Video Analysis During Substrat...
Publication number
20210134637
Publication date
May 6, 2021
TOKYO ELECTRON LIMITED
Michael Carcasi
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
SYSTEM AND METHOD TO CALIBRATE A PLURALITY OF WAFER INSPECTION SYST...
Publication number
20210131977
Publication date
May 6, 2021
TOKYO ELECTRON LIMITED
Michael Carcasi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
Publication number
20070127916
Publication date
Jun 7, 2007
TOKYO ELECTRON LIMITED
Junichi Kitano
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Heat treatment device and heat treatment method
Publication number
20060096976
Publication date
May 11, 2006
TOKYO ELECTRON LIMITED
Hiroyuki Iwaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Substrate processing apparatus and substrate processing method
Publication number
20040050321
Publication date
Mar 18, 2004
TOKYO ELECTRON LIMITED
Junichi Kitano
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Substrate processing apparatus and substrate processing method
Publication number
20010013161
Publication date
Aug 16, 2001
TOKYO ELECTRON LIMITED
Junichi Kitano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Substrate processing method and substrate processing apparatus
Publication number
20010014372
Publication date
Aug 16, 2001
TOKYO ELECTRON LIMITED
Takayuki Katano
H01 - BASIC ELECTRIC ELEMENTS