Hiroyuki IWATA

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor apparatus and design apparatus
- Patent number 10,496,771
- Issue date Dec 3, 2019
- Renesas Electronics Corporation
- Hiroyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus and design apparatus
- Patent number 10,198,542
- Issue date Feb 5, 2019
- Renesas Electronics Corporation
- Hiroyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test point circuit, scan flip-flop for sequential test, semiconduct...
- Patent number 10,078,114
- Issue date Sep 18, 2018
- Renesas Electronics Corporation
- Hiroyuki Iwata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for designing semiconductor device, and semico...
- Patent number 8,887,015
- Issue date Nov 11, 2014
- Renesas Electronics Corporation
- Hiroyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST POINT CIRCUIT, SCAN FLIP-FLOP FOR SEQUENTIAL TEST, SEMICONDUCT...
- Publication number 20170089979
- Publication date Mar 30, 2017
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki IWATA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR APPARATUS AND DESIGN APPARATUS
- Publication number 20160274184
- Publication date Sep 22, 2016
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki IWATA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DESIGNING SEMICONDUCTOR DEVICE, AND SEMICO...
- Publication number 20130019134
- Publication date Jan 17, 2013
- Renesas Electronics Corporation
- Hiroyuki IWATA
- G06 - COMPUTING CALCULATING COUNTING