Hiroyuki KANAMORI

Follow

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect judging unit of measuring probe and defect judging method th...
- Patent number 11,268,874
- Issue date Mar 8, 2022
- Mitutoyo Corporation
- Akinori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit and measuring system
- Patent number 11,047,678
- Issue date Jun 29, 2021
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 10,415,949
- Issue date Sep 17, 2019
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 10,393,495
- Issue date Aug 27, 2019
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Method and rotary encoder for estimation of eccentric value
- Patent number 8,826,718
- Issue date Sep 9, 2014
- Mitutoyo Corporation
- Hiroyuki Kanamori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTABLE UPDATE RATE FOR MEASURING PROBE
- Publication number 20240077296
- Publication date Mar 7, 2024
- MITUTOYO CORPORATION
- Scott Allen HARSILA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT JUDGING UNIT OF MEASURING PROBE AND DEFECT JUDGING METHOD TH...
- Publication number 20200386646
- Publication date Dec 10, 2020
- MITUTOYO CORPORATION
- Akinori SAITO
- G01 - MEASURING TESTING
Information Patent Application
PROBE UNIT AND MEASURING SYSTEM
- Publication number 20200166336
- Publication date May 28, 2020
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170248400
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170248402
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ROTARY ENCODER FOR ESTIMATION OF ECCENTRIC VALUE
- Publication number 20120151987
- Publication date Jun 21, 2012
- MITUTOYO CORPORATION
- Hiroyuki KANAMORI
- G01 - MEASURING TESTING