Hiroyuki Kobatake

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having memory cell with electrostatic capacita...
- Patent number 9,263,119
- Issue date Feb 16, 2016
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor storage device
- Patent number 9,202,553
- Issue date Dec 1, 2015
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 8,824,189
- Issue date Sep 2, 2014
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile semiconductor memory device
- Patent number 8,592,942
- Issue date Nov 26, 2013
- Renesas Electronics Corporation
- Noriaki Kodama
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit and test method for testing differential input circuit
- Patent number 8,446,163
- Issue date May 21, 2013
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G01 - MEASURING TESTING
Information Patent Grant
Static random access memory (SRAM) and test method of the SRAM havi...
- Patent number 8,432,747
- Issue date Apr 30, 2013
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Static random access memory (SRAM) and test method of the SRAM havi...
- Patent number 8,208,313
- Issue date Jun 26, 2012
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Differential sense amplifier
- Patent number 8,149,640
- Issue date Apr 3, 2012
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor storage device
- Patent number 8,144,523
- Issue date Mar 27, 2012
- RENESAS ELECTRONICS COPORATION
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit and method of testing the same
- Patent number 8,143,910
- Issue date Mar 27, 2012
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G01 - MEASURING TESTING
Information Patent Grant
SRAM and testing method of SRAM
- Patent number 8,085,610
- Issue date Dec 27, 2011
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse data read circuit having control circuit between fuse and curr...
- Patent number 7,911,870
- Issue date Mar 22, 2011
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device and inspection method of th...
- Patent number 7,518,936
- Issue date Apr 14, 2009
- NEC Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20160111141
- Publication date Apr 21, 2016
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Device Having Memory Cell With Electrostatic Capacita...
- Publication number 20160086656
- Publication date Mar 24, 2016
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20150036420
- Publication date Feb 5, 2015
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING MEMORY CELL WITH ELECTROSTATIC CAPACITA...
- Publication number 20140010001
- Publication date Jan 9, 2014
- Hiroyuki KOBATAKE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20130094279
- Publication date Apr 18, 2013
- Renesas Electronics Corporation
- Hiroyuki KOBATAKE
- G11 - INFORMATION STORAGE
Information Patent Application
STATIC RANDOM ACCESS MEMORY (SRAM) AND TEST METHOD OF THE SRAM HAVI...
- Publication number 20120206985
- Publication date Aug 16, 2012
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
Non-volatile semiconductor memory device
- Publication number 20110122672
- Publication date May 26, 2011
- RENESAS ELECTRONICS CORPORATION
- Noriaki Kodama
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20100246243
- Publication date Sep 30, 2010
- NEC ELECTRONICS CORPORATION
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
DIFFERENTIAL SENSE AMPLIFIER
- Publication number 20100232243
- Publication date Sep 16, 2010
- NEC Electronics Corporation
- Hiroyuki KOBATAKE
- G11 - INFORMATION STORAGE
Information Patent Application
SRAM AND TESTING METHOD OF SRAM
- Publication number 20100226190
- Publication date Sep 9, 2010
- NEC ELECTRONICS CORPORATION
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT AND TEST METHOD FOR TESTING DIFFERENTIAL INPUT CIRCUIT
- Publication number 20100201394
- Publication date Aug 12, 2010
- NEC Electronics Corporation
- Hiroyuki Kobatake
- G01 - MEASURING TESTING
Information Patent Application
Static random access memory (SRAM) and test method of the SRAM havi...
- Publication number 20100054062
- Publication date Mar 4, 2010
- NEC Electronic Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit and method of testing the same
- Publication number 20100007368
- Publication date Jan 14, 2010
- NEC Electronics Corporation
- Hiroyuki Kobatake
- G01 - MEASURING TESTING
Information Patent Application
Fuse data read circuit having control circuit between fuse and curr...
- Publication number 20090285036
- Publication date Nov 19, 2009
- NEC Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE
Information Patent Application
Non-volatile semiconductor memory device
- Publication number 20090184350
- Publication date Jul 23, 2009
- NEC Electronics Corporation
- Noriaki Kodama
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device and inspection method of th...
- Publication number 20060221731
- Publication date Oct 5, 2006
- NEC Electronics Corporation
- Hiroyuki Kobatake
- G11 - INFORMATION STORAGE

Hiroyuki Kobatake

Person

Patents Grantslast 30 patents

Semiconductor device having memory cell with electrostatic capacita...

Semiconductor storage device

Semiconductor device

Non-volatile semiconductor memory device

Test circuit and test method for testing differential input circuit

Static random access memory (SRAM) and test method of the SRAM havi...

Static random access memory (SRAM) and test method of the SRAM havi...

Differential sense amplifier

Semiconductor storage device

Semiconductor integrated circuit and method of testing the same

SRAM and testing method of SRAM

Fuse data read circuit having control circuit between fuse and curr...

Semiconductor integrated circuit device and inspection method of th...

Patents Applicationslast 30 patents

SEMICONDUCTOR STORAGE DEVICE

Semiconductor Device Having Memory Cell With Electrostatic Capacita...

SEMICONDUCTOR STORAGE DEVICE

SEMICONDUCTOR DEVICE HAVING MEMORY CELL WITH ELECTROSTATIC CAPACITA...

SEMICONDUCTOR DEVICE

STATIC RANDOM ACCESS MEMORY (SRAM) AND TEST METHOD OF THE SRAM HAVI...

Non-volatile semiconductor memory device

SEMICONDUCTOR STORAGE DEVICE

DIFFERENTIAL SENSE AMPLIFIER

SRAM AND TESTING METHOD OF SRAM

TEST CIRCUIT AND TEST METHOD FOR TESTING DIFFERENTIAL INPUT CIRCUIT

Static random access memory (SRAM) and test method of the SRAM havi...

Semiconductor integrated circuit and method of testing the same

Fuse data read circuit having control circuit between fuse and curr...

Non-volatile semiconductor memory device

Semiconductor integrated circuit device and inspection method of th...