Hiroyuki MAEKAWA

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus and analysis method
- Patent number 9,638,729
- Issue date May 2, 2017
- LASERTEC CORPORATION
- Hiroyuki Maekawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...
- Publication number 20230392919
- Publication date Dec 7, 2023
- Lasertec Corporation
- Yoshihiro NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20140136132
- Publication date May 15, 2014
- Lasertec Corporation
- Hiroyuki MAEKAWA
- G01 - MEASURING TESTING