Hiroyuki Matsuda

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Variable reduction ratio spherical aberration correction electrosta...
- Patent number 11,791,148
- Issue date Oct 17, 2023
- University Corporation National Nara Institute of Science and Technology
- Hiroyuki Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic lens, and parallel beam generation device and paralle...
- Patent number 10,614,992
- Issue date Apr 7, 2020
- National University Corporation Nara Institute of Science and Technology
- Fumihiko Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Spherical aberration corrected electrostatic lens, input lens, elec...
- Patent number 7,655,923
- Issue date Feb 2, 2010
- National University Corporation Nara Institute of Science and Technology
- Hiroshi Daimon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-...
- Publication number 20240047190
- Publication date Feb 8, 2024
- INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTE OF NATURAL...
- Hiroyuki MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE REDUCTION RATIO SPHERICAL ABERRATION CORRECTION ELECTROSTA...
- Publication number 20210193448
- Publication date Jun 24, 2021
- National University Corporation Nara Institute of Science and Technology
- Hiroyuki MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC LENS, AND PARALLEL BEAM GENERATION DEVICE AND PARALLE...
- Publication number 20180211812
- Publication date Jul 26, 2018
- National University Corporation Nara Institute of Science and Technology
- Fumihiko MATSUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spherical Aberration Corrected Electrostatic Lens, Input Lens, Elec...
- Publication number 20080135748
- Publication date Jun 12, 2008
- Hiroshi Daimon
- G01 - MEASURING TESTING