Hiroyuki Matsuura

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample rack
- Patent number 11,346,853
- Issue date May 31, 2022
- Sysmex Corporation
- Kohei Oda
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and method for replacing light source unit
- Patent number 9,810,621
- Issue date Nov 7, 2017
- Sysmex Corporation
- Hiroyuki Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer, transporting apparatus, and lid placing tray
- Patent number 9,702,888
- Issue date Jul 11, 2017
- SYSMEX CORPORATION
- Hiroyuki Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and analyzing method
- Patent number 9,671,417
- Issue date Jun 6, 2017
- Sysmex Corporation
- Hiroyuki Matsuura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE RACK
- Publication number 20200072857
- Publication date Mar 5, 2020
- SYSMEX CORPORATION
- Kohei ODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND METHOD FOR REPLACING LIGHT SOURCE UNIT
- Publication number 20160061714
- Publication date Mar 3, 2016
- SYSMEX CORPORATION
- Hiroyuki MATSUURA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER, TRANSPORTING APPARATUS, AND LID PLACING TRAY
- Publication number 20140294673
- Publication date Oct 2, 2014
- SYSMEX CORPORATION
- Hiroyuki MATSUURA
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER AND ANALYZING METHOD
- Publication number 20140295563
- Publication date Oct 2, 2014
- SYSMEX CORPORATION
- Hiroyuki MATSUURA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND COMPUTER PROGRAM PRODUCT
- Publication number 20090224032
- Publication date Sep 10, 2009
- SYSMEX CORPORATION
- Keitarou KONDOU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS APPARATUS, SAMPLE ANALYSIS METHOD, AND COMPUTER PRO...
- Publication number 20090221090
- Publication date Sep 3, 2009
- SYSMEX CORPORATION
- Keitarou KONDOU
- G01 - MEASURING TESTING