Hiroyuki Miyata

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Sagamihara, JP

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Patents Grantslast 30 patents

Information Patent Grant
Aberration evaluation pattern, aberration evaluation method, aberra...
- Patent number 8,158,310
- Issue date Apr 17, 2012
- Ricoh Company, Ltd.
- Hiroyuki Miyata
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Information reproducing method judging a multivalued level of a pre...
- Patent number 7,082,091
- Issue date Jul 25, 2006
- Ricoh Company, Ltd.
- Akihiko Shimizu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for detecting optimum recording power for an o...
- Patent number 6,052,347
- Issue date Apr 18, 2000
- Ricoh Company, Ltd.
- Hiroyuki Miyata
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ABERRATION EVALUATION PATTERN, ABERRATION EVALUATION METHOD, ABERRA...
- Publication number 20100227200
- Publication date Sep 9, 2010
- RICOH COMPANY, LTD.
- Hiroyuki Miyata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Information reproducing method judging a multivalued level of a pre...
- Publication number 20070121465
- Publication date May 31, 2007
- Akihiko Shimizu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Information reproducing method judging a multivalued level of a pre...
- Publication number 20030112667
- Publication date Jun 19, 2003
- Akihiko Shimizu
- H03 - BASIC ELECTRONIC CIRCUITRY