Hiroyuki Muto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion beam device
- Patent number 10,636,623
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 10,366,858
- Issue date Jul 30, 2019
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 10,304,656
- Issue date May 28, 2019
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and emitter tip adjustment method
- Patent number 9,761,407
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emitter, gas field ion source, and ion beam device
- Patent number 9,087,675
- Issue date Jul 21, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device having gas introduction port disposed on structure...
- Patent number 8,981,315
- Issue date Mar 17, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source and method for using same, ion beam device, an...
- Patent number 8,847,173
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Charged particle beam apparatus, and sample processing and observat...
- Patent number 8,455,824
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus
- Patent number 7,235,798
- Issue date Jun 26, 2007
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam apparatus and sample processing method
- Patent number 7,084,399
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam apparatus and sample processing method
- Patent number 6,822,245
- Issue date Nov 23, 2004
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ion Beam Device
- Publication number 20190295802
- Publication date Sep 26, 2019
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device
- Publication number 20170352517
- Publication date Dec 7, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20170323764
- Publication date Nov 9, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki MUTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Device and Emitter Tip Adjustment Method
- Publication number 20160225575
- Publication date Aug 4, 2016
- Hiroyuki MUTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20140197329
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMITTER, GAS FIELD ION SOURCE, AND ION BEAM DEVICE
- Publication number 20140191128
- Publication date Jul 10, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...
- Publication number 20130119252
- Publication date May 16, 2013
- Yoshimi Kawanami
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...
- Publication number 20120326028
- Publication date Dec 27, 2012
- Hiroyuki MUTO
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...
- Publication number 20090020698
- Publication date Jan 22, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki MUTO
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam apparatus
- Publication number 20050279952
- Publication date Dec 22, 2005
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam apparatus and sample processing method
- Publication number 20050092922
- Publication date May 5, 2005
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam apparatus and sample processing method
- Publication number 20020008208
- Publication date Jan 24, 2002
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS

Hiroyuki Muto

Person

Patents Grantslast 30 patents

Ion beam device

Ion beam device

Ion beam device

Ion beam device and emitter tip adjustment method

Emitter, gas field ion source, and ion beam device

Ion beam device having gas introduction port disposed on structure...

Gas field ion source and method for using same, ion beam device, an...

Charged particle beam apparatus, and sample processing and observat...

Focused ion beam apparatus

Ion beam apparatus and sample processing method

Ion beam apparatus and sample processing method

Patents Applicationslast 30 patents

Ion Beam Device

Ion Beam Device

ION BEAM DEVICE

Ion Beam Device and Emitter Tip Adjustment Method

ION BEAM DEVICE

EMITTER, GAS FIELD ION SOURCE, AND ION BEAM DEVICE

GAS FIELD ION SOURCE AND METHOD FOR USING SAME, ION BEAM DEVICE, AN...

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...

Focused ion beam apparatus

Ion beam apparatus and sample processing method

Ion beam apparatus and sample processing method