Hiroyuki Nakano

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for laser projection, and machining method
- Patent number 10,094,652
- Issue date Oct 9, 2018
- Mitsubishi Hitachi Power Systems, Ltd.
- Hiroyuki Nakano
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for laser projection, and machining method
- Patent number 9,644,942
- Issue date May 9, 2017
- Mitsubishi Hitachi Power Systems, Ltd.
- Hiroyuki Nakano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for inspecting pattern defect and device for realizing the same
- Patent number 8,748,795
- Issue date Jun 10, 2014
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 8,634,069
- Issue date Jan 21, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection system and ultrasonic inspection method
- Patent number 8,616,062
- Issue date Dec 31, 2013
- Hitachi-GE Nuclear Energy, Ltd.
- Naoyuki Kono
- G01 - MEASURING TESTING
Information Patent Grant
Optical transmission equipment and method for controlling thereof
- Patent number 8,515,287
- Issue date Aug 20, 2013
- Hitachi, Ltd.
- Kenichi Ogawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting defects
- Patent number 8,462,330
- Issue date Jun 11, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting defects
- Patent number 8,411,264
- Issue date Apr 2, 2013
- Hitachi High-Technologies Corporation
- Takeo Ueno
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 8,289,507
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 8,218,138
- Issue date Jul 10, 2012
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting defects
- Patent number 8,121,398
- Issue date Feb 21, 2012
- Hitachi High-Technologies Corporation
- Yasuhiro Yoshitake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting defects
- Patent number 8,107,065
- Issue date Jan 31, 2012
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Optical transmission equipment and optical network
- Patent number 8,041,213
- Issue date Oct 18, 2011
- Hitachi, Ltd.
- Hiroyuki Nakano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,973,920
- Issue date Jul 5, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,952,700
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Optical transmission equipment and optical add-drop multiplexer
- Patent number 7,953,321
- Issue date May 31, 2011
- Hitachi, Ltd.
- Yasuhiro Uchiyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical transmission apparatus with optical amplifiers
- Patent number 7,941,049
- Issue date May 10, 2011
- Hitachi, Ltd.
- Hiroyuki Nakano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect inspection method and system
- Patent number 7,859,656
- Issue date Dec 28, 2010
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,817,261
- Issue date Oct 19, 2010
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Optical transmission apparatus and control method therefor
- Patent number 7,809,263
- Issue date Oct 5, 2010
- Hitachi, Ltd.
- Tetsuya Uda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical transmission system and signal speed converting apparatus
- Patent number 7,769,257
- Issue date Aug 3, 2010
- Hitachi, Ltd.
- Nobuhiko Kikuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for inspecting defects
- Patent number 7,768,635
- Issue date Aug 3, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects
- Patent number 7,751,037
- Issue date Jul 6, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting foreign particle defects
- Patent number 7,724,360
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Optical transmision apparatus and control method therefor
- Patent number 7,725,034
- Issue date May 25, 2010
- Hitachi Communication Technologies, Inc.
- Tetsuya Uda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical transmission equipment and optical add-drop multiplexer
- Patent number 7,697,845
- Issue date Apr 13, 2010
- Hitachi Communication Technologies, Ltd.
- Yasuhiro Uchiyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting defects
- Patent number 7,643,139
- Issue date Jan 5, 2010
- Hitachi High-Technologies Corporation
- Yoshimasa Ohshima
- G01 - MEASURING TESTING
Information Patent Grant
Optical transmission device equipped with pluggable variable optica...
- Patent number 7,554,717
- Issue date Jun 30, 2009
- Hitachi Communication Technologies, Ltd.
- Hiroyuki Nakano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting defects
- Patent number 7,528,942
- Issue date May 5, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-division multiplexing optical transmitter
- Patent number 7,526,200
- Issue date Apr 28, 2009
- Hitachi Communication Technologies, Ltd.
- Hiroyuki Nakano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
DISPLAY DEVICE WITH TOUCH PANEL
- Publication number 20170199607
- Publication date Jul 13, 2017
- Mitsubishi Electric Corporation
- Hiroyuki NAKANO
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20160364851
- Publication date Dec 15, 2016
- Hitachi, Ltd
- Takaaki KONISHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR LASER PROJECTION, AND MACHINING METHOD
- Publication number 20160273905
- Publication date Sep 22, 2016
- MITSUBISHI HITACHI POWER SYSTEMS, LTD.
- Hiroyuki NAKANO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND APPARATUS FOR LASER PROJECTION, AND MACHINING METHOD
- Publication number 20140148939
- Publication date May 29, 2014
- Hitachi, Ltd
- Hiroyuki NAKANO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF INSTALLING JET PUMP BEAM
- Publication number 20120216382
- Publication date Aug 30, 2012
- Hitachi-GE Nuclear Energy, Ltd.
- Masahiro HIRATSUKA
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS
- Publication number 20120194809
- Publication date Aug 2, 2012
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Inspecting Defects
- Publication number 20110255074
- Publication date Oct 20, 2011
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110228258
- Publication date Sep 22, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION SYSTEM AND ULTRASONIC INSPECTION METHOD
- Publication number 20110197679
- Publication date Aug 18, 2011
- HITACHI-GE NUCLEAR ENERGY, LTD.
- Naoyuki KONO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20110149275
- Publication date Jun 23, 2011
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method and System
- Publication number 20110075134
- Publication date Mar 31, 2011
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECTS
- Publication number 20110063603
- Publication date Mar 17, 2011
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110032515
- Publication date Feb 10, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS
- Publication number 20100271628
- Publication date Oct 28, 2010
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECTS
- Publication number 20100265496
- Publication date Oct 21, 2010
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
Optical Transmission Equipment And Optical Add-Drop Multiplexer
- Publication number 20100172644
- Publication date Jul 8, 2010
- Yasuhiro Uchiyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS
- Publication number 20100103409
- Publication date Apr 29, 2010
- Yoshimasa Ohshima
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Inspecting Defects
- Publication number 20100014075
- Publication date Jan 21, 2010
- Hitachi High-Technologies Corporation
- Takeo Ueno
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Inspecting Defects
- Publication number 20100014083
- Publication date Jan 21, 2010
- Hitachi High-Technologies Corporation
- Takeo Ueno
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TRANSMISSION APPARATUS AND CONTROL METHOD THEREFOR
- Publication number 20090324229
- Publication date Dec 31, 2009
- Hitachi Communication Technologies , Inc.
- Tetsuya UDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL TRANSMISSION DEVICE AND OPTICAL TRANSMISSION METHOD
- Publication number 20090317078
- Publication date Dec 24, 2009
- Hitachi Communication Technologies, Ltd.
- Tetsuya UDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and Apparatus for Inspecting Defects
- Publication number 20090257647
- Publication date Oct 15, 2009
- Yasuhiro Yoshitake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS
- Publication number 20090213366
- Publication date Aug 27, 2009
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TRANSMISSION EQUIPMENT AND OPTICAL NETWORK
- Publication number 20090142057
- Publication date Jun 4, 2009
- Hiroyuki Nakano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Defect Inspection Method And System
- Publication number 20090141269
- Publication date Jun 4, 2009
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Inspecting Defects
- Publication number 20090122303
- Publication date May 14, 2009
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TRANSMISSION SYSTEM AND SIGNAL SPEED CONVERTING APPARATUS
- Publication number 20090116839
- Publication date May 7, 2009
- Hitachi Communications Technologies, Ltd.
- Nobuhiko Kikuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method For Inspecting Pattern Defect And Device For Realizing The Same
- Publication number 20090091750
- Publication date Apr 9, 2009
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TRANSMISSION APPARATUS AND CONTROL METHOD THEREFOR
- Publication number 20090087185
- Publication date Apr 2, 2009
- Hitachi Communication Technologies, Ltd.
- Tetsuya UDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING FOREIGN PARTICLE DEFECTS
- Publication number 20090079973
- Publication date Mar 26, 2009
- Sachio Uto
- G01 - MEASURING TESTING

Hiroyuki Nakano

Person

Patents Grantslast 30 patents

Method and apparatus for laser projection, and machining method

Method and apparatus for laser projection, and machining method

Method for inspecting pattern defect and device for realizing the same

Defect inspection device and defect inspection method

Ultrasonic inspection system and ultrasonic inspection method

Optical transmission equipment and method for controlling thereof

Method and apparatus for detecting defects

Method and apparatus for inspecting defects

Method of apparatus for detecting particles on a specimen

Apparatus and method for inspecting defects

Method and apparatus for inspecting defects

Method and apparatus for detecting defects

Optical transmission equipment and optical network

Apparatus and method for inspecting defects

Method of apparatus for detecting particles on a specimen

Optical transmission equipment and optical add-drop multiplexer

Optical transmission apparatus with optical amplifiers

Defect inspection method and system

Method of apparatus for detecting particles on a specimen

Optical transmission apparatus and control method therefor

Optical transmission system and signal speed converting apparatus

Apparatus and method for inspecting defects

Method and apparatus for detecting defects

Method and apparatus for inspecting foreign particle defects

Optical transmision apparatus and control method therefor

Optical transmission equipment and optical add-drop multiplexer

Method and apparatus for detecting defects

Optical transmission device equipped with pluggable variable optica...

Method and apparatus for detecting defects

Wavelength-division multiplexing optical transmitter

Patents Applicationslast 30 patents

DISPLAY DEVICE WITH TOUCH PANEL

DEFECT INSPECTION METHOD AND APPARATUS

METHOD AND APPARATUS FOR LASER PROJECTION, AND MACHINING METHOD

METHOD AND APPARATUS FOR LASER PROJECTION, AND MACHINING METHOD

METHOD OF INSTALLING JET PUMP BEAM

METHOD AND APPARATUS FOR DETECTING DEFECTS

Apparatus and Method for Inspecting Defects

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

ULTRASONIC INSPECTION SYSTEM AND ULTRASONIC INSPECTION METHOD

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Defect Inspection Method and System

APPARATUS AND METHOD FOR INSPECTING DEFECTS

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

METHOD AND APPARATUS FOR DETECTING DEFECTS

APPARATUS AND METHOD FOR INSPECTING DEFECTS

Optical Transmission Equipment And Optical Add-Drop Multiplexer

METHOD AND APPARATUS FOR DETECTING DEFECTS

Method and Apparatus for Inspecting Defects

Method and Apparatus for Inspecting Defects

OPTICAL TRANSMISSION APPARATUS AND CONTROL METHOD THEREFOR

OPTICAL TRANSMISSION DEVICE AND OPTICAL TRANSMISSION METHOD

Method and Apparatus for Inspecting Defects

METHOD AND APPARATUS FOR DETECTING DEFECTS

OPTICAL TRANSMISSION EQUIPMENT AND OPTICAL NETWORK

Defect Inspection Method And System

Apparatus And Method For Inspecting Defects

OPTICAL TRANSMISSION SYSTEM AND SIGNAL SPEED CONVERTING APPARATUS

Method For Inspecting Pattern Defect And Device For Realizing The Same

OPTICAL TRANSMISSION APPARATUS AND CONTROL METHOD THEREFOR

METHOD AND APPARATUS FOR INSPECTING FOREIGN PARTICLE DEFECTS